Matrix description of coherent and incoherent light reflection and transmission by anisotropic multilayer structures

We propose a matrix method for the description of light reflection and transmission by an anisotropic multilayer system consisting of thin and thick layers. A method based on partial-wave matrix summations is applicable in the field of reflection and transmission photometry and ellipsometry. In the case of a thin anisotropic film, the interference effects were described by use of a coherent summation of Jones matrices. Incoherent intensity summations for a thick weakly anisotropic layer were characterized by use of the coherency vector formalism. Observable quantities or Mueller matrix components were obtained from the matrix describing transformation of the coherence vectors. OCIS codes: 260.1180, 260.1440, 260.2130, 313.6860, 120.2130.