[differential]n/[differential]T Measurements performed with guided waves and their application to the temperature sensitivity of wavelength-division multiplexing filters

Measurements of [differential]n/[differential]T of thin films by the m-lines technique are presented. The importance of the substrate material is shown. An example of the wavelength shift of an optical thin-film filter with temperature is studied both theoretically and experimentally. The theoretical wavelength shift of a dense wavelength-division multiplexing filter is discussed. OCIS codes: 310.6860, 350.2460.