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Who is doing what with supplier-to-fab e-diagnostics. (E-Diagnostics)

Authors :
Burggraaf, Pieter Pete
Source :
Solid State Technology. September, 2002, Vol. 45 Issue 9, p38, 5 p.
Publication Year :
2002

Abstract

OVERVIEW It is widely stated that wafer fab and tool efficiency must be improved, particularly as 300mm manufacturing comes on line, and that e-diagnostics via a supplier-to-user link will be […]

Details

Language :
English
ISSN :
0038111X
Volume :
45
Issue :
9
Database :
Gale General OneFile
Journal :
Solid State Technology
Publication Type :
Periodical
Accession number :
edsgcl.92600439