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Fault management of multicell converters

Authors :
Turpin, Christophe
Baudesson, Philippe
Richardeau, Frederic
Forest, Francois
Meynard, Thierry A.
Source :
IEEE Transactions on Industrial Electronics. Oct, 2002, Vol. 49 Issue 5, p988, 10 p.
Publication Year :
2002

Abstract

Component counts and oversimplified reliability rules may lead to the conclusion that multilevel converters are less safe than two-level converters, just because they use more components. A better approach might be to consider that they use a different arrangement of components and also that the consequence of faults may be very different. This paper is focused on the study of the consequences of faults in hard-switching and soft-switching multicell converters. Solutions to minimize the consequences of major faults are described. Index Terms--Fault currents, fault detection, fault location, fault tolerance, insulated gate bipolar transistors, multilevel systems, power electronics, power systems harmonics.

Details

ISSN :
02780046
Volume :
49
Issue :
5
Database :
Gale General OneFile
Journal :
IEEE Transactions on Industrial Electronics
Publication Type :
Academic Journal
Accession number :
edsgcl.93085857