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Quartz microbalance studies of an adsorbed helium film.
- Source :
- Physical Review Letters. 29
- Publication Year :
- 1972
- Publisher :
- United States: NASA Center for Aerospace Information (CASI), 1972.
-
Abstract
- The resonant frequency of a quartz crystal oscillating in the thickness-shear mode changes by virtue of the mass loading due to any type of film laid down on its surfaces. For a helium film only the normal fraction remains rigidly coupled to the substrate motion. Adsorption isotherms of He-4 measured with this technique show clear departures from conventional nonsuperfluid behavior. We attribute this effect to the onset and presence of superfluidity in the film.
- Subjects :
- Physics, Solid-State
Subjects
Details
- Language :
- English
- Volume :
- 29
- Database :
- NASA Technical Reports
- Journal :
- Physical Review Letters
- Publication Type :
- Report
- Accession number :
- edsnas.19720053009
- Document Type :
- Report
- Full Text :
- https://doi.org/10.1103/PhysRevLett.29.211