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Quartz microbalance studies of an adsorbed helium film.

Authors :
Chester, M
Yang, L. C
Stephens, J. B
Source :
Physical Review Letters. 29
Publication Year :
1972
Publisher :
United States: NASA Center for Aerospace Information (CASI), 1972.

Abstract

The resonant frequency of a quartz crystal oscillating in the thickness-shear mode changes by virtue of the mass loading due to any type of film laid down on its surfaces. For a helium film only the normal fraction remains rigidly coupled to the substrate motion. Adsorption isotherms of He-4 measured with this technique show clear departures from conventional nonsuperfluid behavior. We attribute this effect to the onset and presence of superfluidity in the film.

Subjects

Subjects :
Physics, Solid-State

Details

Language :
English
Volume :
29
Database :
NASA Technical Reports
Journal :
Physical Review Letters
Publication Type :
Report
Accession number :
edsnas.19720053009
Document Type :
Report
Full Text :
https://doi.org/10.1103/PhysRevLett.29.211