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Glancing incidence telescopes for space astronomy

Authors :
Alonso, J., Jr
Source :
Significant Accomplishments in Technol., 1972.
Publication Year :
1973
Publisher :
United States: NASA Center for Aerospace Information (CASI), 1973.

Abstract

A technique for determining the state of polarization of a light source by evaluating its image at the focus of a glancing telescope is reported. An analysis of the central disc of the diffraction image reveals if the light source is polarized, the plane of polarization, and the degree of polarization. When polarized light is incident at the aperture of a diffraction limited glancing telescope, the central disc of the diffraction pattern takes on an elliptical configuration. This ellipticity is caused by the tendency of the electric vector component in the plane of incidence to be absorbed by the reflecting material. As the state of polarization goes from plane polarized to decreasing degrees of elliptically polarized light, the ellipticity of the central disc goes from a maximum at plane polarization to zero at circular polarization. These curves give a direct relationship between the degree of polarization of a light source and the ellipticity of the central disc for this particular telescope, independent of the light source wavelength.

Subjects

Subjects :
Instrumentation And Photography

Details

Language :
English
Database :
NASA Technical Reports
Journal :
Significant Accomplishments in Technol., 1972
Publication Type :
Report
Accession number :
edsnas.19730019108
Document Type :
Report