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Segregation behavior in a stationary vertical zone with converging interfaces - Pressure-induced segregation effects

Authors :
Kim, K. M
Witt, A. F
Gatos, H. C
Source :
Electrochemical Society.
Publication Year :
1974
Publisher :
United States: NASA Center for Aerospace Information (CASI), 1974.

Abstract

Crystal growth and segregation were investigated in a confined vertical melt zone in which the upper solid-melt interface advanced under destabilizing and the lower interface under stabilizing thermal gradients. A technique reported by Kim et al. (1972) was used in the study. The experimental results are discussed, giving attention to interface morphology and growth rate and questions of dopant segregation. Dopant inhomogeneities formed simultaneously in both advancing interfaces can be explained on the basis of pressure induced segregation effects.

Subjects

Subjects :
Materials, Metallic

Details

Language :
English
Database :
NASA Technical Reports
Journal :
Electrochemical Society
Publication Type :
Report
Accession number :
edsnas.19740040049
Document Type :
Report