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Analysis of the profile characteristics of corn and soybeans using field reflectance data

Authors :
Crist, E. P
Publication Year :
1982
Publisher :
United States: NASA Center for Aerospace Information (CASI), 1982.

Abstract

The typical patterns of spectral development (profiles) for corn and soybeans are presented, based on field-collected reflectance data transformed to correspond to LANDSAT-MSS Tasseled Cap coordinates. Reasonable variations in field conditions and cultural practices are shown to significantly influence profile features. The separability of the two crops is determined to be primarily related to the maximum value of the reflectance equivalent of Greenness, and to the plateau effect seen in corn Greenness profiles. The impact of changes in conditions on separability is described. In addition, association is made between profile features and stages of development for corn and soybeans. Corn is shown to peak at a stage well before tasseling or maximum LAI, while the characteristics of the soybean profile are shown to be unrelated to any particular stage of development.

Details

Language :
English
Database :
NASA Technical Reports
Notes :
NAS9-16538, , PROJ. AGRISTARS
Publication Type :
Report
Accession number :
edsnas.19830004231
Document Type :
Report