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Single-Event Effect Performance of a Commercial ReRAM
- Publication Year :
- 2014
- Publisher :
- United States: NASA Center for Aerospace Information (CASI), 2014.
-
Abstract
- We show heavy ion test results of a commercial production-level ReRAM. The memory array is robust to bit upsets. However the ReRAM system is vulnerable to SEFI.
- Subjects :
- Electronics And Electrical Engineering
Subjects
Details
- Language :
- English
- Database :
- NASA Technical Reports
- Notes :
- NNG13CR48C
- Publication Type :
- Report
- Accession number :
- edsnas.20150000273
- Document Type :
- Report