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Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies
- Publication Year :
- 2014
- Publisher :
- United States: NASA Center for Aerospace Information (CASI), 2014.
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Abstract
- We report low-energy proton and low-energy alpha particle single-event effects (SEE) data on a 32 nm silicon-on-insulator (SOI) complementary metal oxide semiconductor (CMOS) latches and static random access memory (SRAM) that demonstrates the criticality of using low-energy protons for SEE testing of highly-scaled technologies. Low-energy protons produced a significantly higher fraction of multi-bit upsets relative to single-bit upsets when compared to similar alpha particle data. This difference highlights the importance of performing hardness assurance testing with protons that include energy distribution components below 2 megaelectron-volt. The importance of low-energy protons to system-level single-event performance is based on the technology under investigation as well as the target radiation environment.
- Subjects :
- Physics Of Elementary Particles And Fields
Electronics And Electrical Engineering
Subjects
Details
- Language :
- English
- Database :
- NASA Technical Reports
- Notes :
- DE-AC04-94AL85000, , NNG13CR48C
- Publication Type :
- Report
- Accession number :
- edsnas.20150000377
- Document Type :
- Report