EFFECTS ON MIXED NEUTRON-GAMMA PULSES ON ELECTRONIC COMPONENTS

The experiments described were conducted to compare the effects of pulsed nuclear radiation upon electronic components at the KEWB, TRIGA, and LINAC facilities with those already observed at the GODIVA II pulsed reactor. The transient effects were displayed on oscilloscopes and photographed with Polaroid cameras. All components tested at KEWB and TRIGA showed a transient change in the measured parameters. The transient changes of resistors did not exceed 3%. In the capacitors a 4-ua leakage current with an equivalent 10-megohm shunt resistance was observed. The results obtained from the tests of components at the LINAC were inconclusive. (Author)