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Selected SOI puzzles and tentative answers

Authors :: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC) ; Université de Savoie - Université Joseph Fourier - Grenoble I - Institut National Polytechnique de Grenoble (INPG) - CNRS
Laboratoire d'Electronique et des Technologies de l'Information (LETI) ; CEA
Na, K.-I.
Van Den Daele, W.
Pham-Nguyen, L.
Bawedin, M.
Park, K.-H.
Wan, J.
Tacchi, K.
Chang, S.-J.
Ionica, I.
Bae, Y.-H.
Chroboczek, J.-A.
Fenouillet-Beranger, C.
Ernst, T.
Augendre, E.
Le Royer, C.
Zaslavsky, A.
Iwai, H.
Cristoloveanu, S.
Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC) ; Université de Savoie - Université Joseph Fourier - Grenoble I - Institut National Polytechnique de Grenoble (INPG) - CNRS
Laboratoire d'Electronique et des Technologies de l'Information (LETI) ; CEA
Na, K.-I.
Van Den Daele, W.
Pham-Nguyen, L.
Bawedin, M.
Park, K.-H.
Wan, J.
Tacchi, K.
Chang, S.-J.
Ionica, I.
Bae, Y.-H.
Chroboczek, J.-A.
Fenouillet-Beranger, C.
Ernst, T.
Augendre, E.
Le Royer, C.
Zaslavsky, A.
Iwai, H.
Cristoloveanu, S.
Source :: 1st Ukrainian-French Symposium 'Semiconductor-On-Insulator Materials, Devices and Circuits: Physics, Technology and Diagnostics; 1st Ukrainian-French Symposium 'Semiconductor-On-Insulator Materials, Devices and Circuits: Physics, Technology and Diagnostics, Oct 2010, Kiev, Ukraine
Abstract: International audience

Details

Database :: OAIster
Journal :: 1st Ukrainian-French Symposium 'Semiconductor-On-Insulator Materials, Devices and Circuits: Physics, Technology and Diagnostics; 1st Ukrainian-French Symposium 'Semiconductor-On-Insulator Materials, Devices and Circuits: Physics, Technology and Diagnostics, Oct 2010, Kiev, Ukraine
Notes :: Kiev, Ukraine, 1st Ukrainian-French Symposium 'Semiconductor-On-Insulator Materials, Devices and Circuits: Physics, Technology and Diagnostics, English
Publication Type :: Electronic Resource
Accession number :: edsoai.ocn893170124
Document Type :: Electronic Resource