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In-depth analysis of 3D Silicon nanowire SONOS memory characteristics by TCAD simulations
- Source :
- 2nd International Memory Workshop; 2nd International Memory Workshop, Dec 2009, South Korea
-
Abstract
- International audience
Details
- Database :
- OAIster
- Journal :
- 2nd International Memory Workshop; 2nd International Memory Workshop, Dec 2009, South Korea
- Notes :
- 2nd International Memory Workshop, English
- Publication Type :
- Electronic Resource
- Accession number :
- edsoai.ocn893170419
- Document Type :
- Electronic Resource