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X-ray Measurement of the subpixel structure of the XMM EPIC MOS CCD
- Authors :
- 常深, 博
吉田, 久美
Short, A. D.
Bennie, P. J.
Turner, M. J. L
Tsunemi, Hiroshi
Yoshita, K.
Abbey, A. F.
常深, 博
吉田, 久美
Short, A. D.
Bennie, P. J.
Turner, M. J. L
Tsunemi, Hiroshi
Yoshita, K.
Abbey, A. F.
- Publication Year :
- 2015
Details
- Database :
- OAIster
- Notes :
- English
- Publication Type :
- Electronic Resource
- Accession number :
- edsoai.ocn922317248
- Document Type :
- Electronic Resource