Generation-recombination noise: The fundamental sensitivity limit for kinetic inductance detectors

MLA

De Visser, P. J.(author), et al. Generation-Recombination Noise: The Fundamental Sensitivity Limit for Kinetic Inductance Detectors. 2012. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsoai&AN=edsoai.on1008792298&authtype=sso&custid=ns315887.

APA

De Visser, P. J. (author), Baselmans, J. J. A. (author), Diener, P. (author), Yates, S. J. C. (author), Endo, A. (author), & Klapwijk, T. M. (author). (2012). Generation-recombination noise: The fundamental sensitivity limit for kinetic inductance detectors.

Chicago

De Visser, P.J. (author), J.J.A. (author) Baselmans, P. (author) Diener, S.J.C. (author) Yates, A. (author) Endo, and T.M. (author) Klapwijk. 2012. “Generation-Recombination Noise: The Fundamental Sensitivity Limit for Kinetic Inductance Detectors.” http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsoai&AN=edsoai.on1008792298&authtype=sso&custid=ns315887.