Cite
Contrast imaging of junctions and recombination activity in MWIR HgCdTe reactive-ion etched n-on-p photodiodes
MLA
Gluszak, Edward A., et al. “Contrast Imaging of Junctions and Recombination Activity in MWIR HgCdTe Reactive-Ion Etched n-on-p Photodiodes.” Research Outputs Pre 2011, 2002. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsoai&AN=edsoai.on1024083828&authtype=sso&custid=ns315887.
APA
Gluszak, E. A., Gluszak, E. A., Hinckley, S., & Griffin, B. J. (2002). Contrast imaging of junctions and recombination activity in MWIR HgCdTe reactive-ion etched n-on-p photodiodes. Research Outputs Pre 2011.
Chicago
Gluszak, Edward A, Edward A Gluszak, Steven Hinckley, and B J Griffin. 2002. “Contrast Imaging of Junctions and Recombination Activity in MWIR HgCdTe Reactive-Ion Etched n-on-p Photodiodes.” Research Outputs Pre 2011. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsoai&AN=edsoai.on1024083828&authtype=sso&custid=ns315887.