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Noise modelling of 0.25 µm fully depleted SOI MOSFETs
- Authors :
- UCL - FSA/ELEC - Département d'électricité
Pailloncy, G.
Dambrine, G.
Danneville, F.
Iniguez, B.
Raskin, Jean-Pierre
17th International Conference on Noise and Fluctuations – ICNF 2003
UCL - FSA/ELEC - Département d'électricité
Pailloncy, G.
Dambrine, G.
Danneville, F.
Iniguez, B.
Raskin, Jean-Pierre
17th International Conference on Noise and Fluctuations – ICNF 2003
- Publication Year :
- 2003
Details
- Database :
- OAIster
- Notes :
- English
- Publication Type :
- Electronic Resource
- Accession number :
- edsoai.on1130505833
- Document Type :
- Electronic Resource