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Design and characterization of ultra-low-power SOI-CMOS IC temperature level detector

Authors :
University of Technology of Petronas - Department of Electrical and Electronic Engineering, Ipoh
UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique
Assaad, Maher
Boufouss, El Hafed
Gérard, Pierre
Francis, Laurent
Flandre, Denis
University of Technology of Petronas - Department of Electrical and Electronic Engineering, Ipoh
UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique
Assaad, Maher
Boufouss, El Hafed
Gérard, Pierre
Francis, Laurent
Flandre, Denis
Source :
Electronics Letters, Vol. 48, no. 14, p. 842-844 (5 July 2012)
Publication Year :
2012

Abstract

Described are the design and characterisation of an ultra-low-power temperature level detector (TLD) and temperature sensor based on a silicon-on-insulator (SOI) CMOS integrated circuit (IC) for harsh environment applications. Since this IC is mainly for harsh environment applications (e.g. high temperatures and radiations), it has been designed and manufactured using the 1 µm high-temperature SOI-CMOS technology provided by X-FAB. The measured power dissipation of the TLD circuit is 9 µW at a supply voltage of 5 V and temperature of 27 °C, according to the measurement results of the manufactured design.

Details

Database :
OAIster
Journal :
Electronics Letters, Vol. 48, no. 14, p. 842-844 (5 July 2012)
Notes :
English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1130512716
Document Type :
Electronic Resource