Study of planar defect filtering in InP gwoun on Si by epitaxial lateral overgrowth

MLA

Junesand, Carl, et al. Study of Planar Defect Filtering in InP Gwoun on Si by Epitaxial Lateral Overgrowth. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsoai&AN=edsoai.on1234395584&authtype=sso&custid=ns315887. Accessed 28 Feb. 2025.

APA

Junesand, C., Kataria, H., Metaferia, W., Julian, N., Wang, Z., Sun, Y., Bowers, J., Pozina, G., Hultman, L., & Lourdudoss, S. (n.d.). Study of planar defect filtering in InP gwoun on Si by epitaxial lateral overgrowth.

Chicago

Junesand, Carl, Himanshu Kataria, Wondwosen Metaferia, Nick Julian, Zhechao Wang, Yanting Sun, John Bowers, Galia Pozina, Lars Hultman, and Sebastian Lourdudoss. 2025. “Study of Planar Defect Filtering in InP Gwoun on Si by Epitaxial Lateral Overgrowth.” Accessed February 28. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsoai&AN=edsoai.on1234395584&authtype=sso&custid=ns315887.