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Miniaturization of CMOS

Authors :
Radamson, Henry H.
He, Xiaobin
Zhang, Qingzhu
Liu, Jonbiao
Cui, Hushan
Xiang, Jinjuan
Kong, Zhenzhen
Xiong, Wenjuan
Li, Junjie
Gao, Jianfeng
Yang, Hong
Gu, Shihai
Zhao, Xuewei
Du, Yong
Yu, Jiahan
Wang, Guilei
Radamson, Henry H.
He, Xiaobin
Zhang, Qingzhu
Liu, Jonbiao
Cui, Hushan
Xiang, Jinjuan
Kong, Zhenzhen
Xiong, Wenjuan
Li, Junjie
Gao, Jianfeng
Yang, Hong
Gu, Shihai
Zhao, Xuewei
Du, Yong
Yu, Jiahan
Wang, Guilei
Publication Year :
2019

Abstract

When the international technology roadmap of semiconductors (ITRS) started almost five decades ago, the metal oxide effect transistor (MOSFET) as units in integrated circuits (IC) continuously miniaturized. The transistor structure has radically changed from its original planar 2D architecture to today's 3D Fin field-effect transistors (FinFETs) along with new designs for gate and source/drain regions and applying strain engineering. This article presents how the MOSFET structure and process have been changed (or modified) to follow the More Moore strategy. A focus has been on methodologies, challenges, and difficulties when ITRS approaches the end. The discussions extend to new channel materials beyond the Moore era.

Details

Database :
OAIster
Notes :
application/pdf, English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1234567149
Document Type :
Electronic Resource
Full Text :
https://doi.org/10.3390.mi10050293