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Balancing of residual stress in thin film iridium by utilizing chromium as an underlayer

Authors :
Massahi, S.
Vu, L. M.
Ferreira, D. D.M.
Christensen, F. E.
Gellert, N.
Henriksen, P. L.
Svendsen, S.
Jegers, A. S.
Collon, M.
Landgraf, B.
Girou, D.
Thete, A.
Shortt, B.
Ferreira, I.
Bavdaz, M.
Massahi, S.
Vu, L. M.
Ferreira, D. D.M.
Christensen, F. E.
Gellert, N.
Henriksen, P. L.
Svendsen, S.
Jegers, A. S.
Collon, M.
Landgraf, B.
Girou, D.
Thete, A.
Shortt, B.
Ferreira, I.
Bavdaz, M.
Source :
Massahi , S , Vu , L M , Ferreira , D D M , Christensen , F E , Gellert , N , Henriksen , P L , Svendsen , S , Jegers , A S , Collon , M , Landgraf , B , Girou , D , Thete , A , Shortt , B , Ferreira , I & Bavdaz , M 2020 , ' Balancing of residual stress in thin film iridium by utilizing chromium as an underlayer ' , Space Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray , 14/12/2020 - 18/12/2020 .
Publication Year :
2020

Abstract

The demand for X-ray optics increases and so do their performance requirements. Iridium (Ir) thin film coatings have proven to be very robust and exhibit excellent reflective properties within the X-ray regime. However, the residual stress in Ir thin films is high and studies show that thin film Ir coatings with a thickness of 10–30 nm exhibit residual compressive stress1 as illustrated in Figure 1.

Details

Database :
OAIster
Journal :
Massahi , S , Vu , L M , Ferreira , D D M , Christensen , F E , Gellert , N , Henriksen , P L , Svendsen , S , Jegers , A S , Collon , M , Landgraf , B , Girou , D , Thete , A , Shortt , B , Ferreira , I & Bavdaz , M 2020 , ' Balancing of residual stress in thin film iridium by utilizing chromium as an underlayer ' , Space Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray , 14/12/2020 - 18/12/2020 .
Notes :
application/pdf, English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1248605637
Document Type :
Electronic Resource