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Accurate capacitance-voltage characterization of organic thin films with current injection*

Authors :
Chu, Ming
Liu, Shao-Bo
Yu, An-Ran
Yu, Hao-Miao
Qin, Jiajun
Yi, Rui-Chen
Pei, Yuan
Zhu, Chun-Qin
Zhu, Guang-Rui
Zeng, Qi
Hou, Xiao-Yuan
Chu, Ming
Liu, Shao-Bo
Yu, An-Ran
Yu, Hao-Miao
Qin, Jiajun
Yi, Rui-Chen
Pei, Yuan
Zhu, Chun-Qin
Zhu, Guang-Rui
Zeng, Qi
Hou, Xiao-Yuan
Publication Year :
2021

Abstract

To deal with the invalidation of commonly employed series model and parallel model in capacitance-voltage (C-V) characterization of organic thin films when current injection is significant, a three-element equivalent circuit model is proposed. On this basis, the expression of real capacitance in consideration of current injection is theoretically derived by small-signal analysis method. The validity of the proposed equivalent circuit and theoretical expression are verified by a simulating circuit consisting of a capacitor, a diode, and a resistor. Moreover, the accurate C-V characteristic of an organic thin film device is obtained via theoretical correction of the experimental measuring result, and the real capacitance is 35.7% higher than the directly measured capacitance at 5-V bias in the parallel mode. This work strongly demonstrates the necessity to consider current injection in C-V measurement and provides a strategy for accurate C-V characterization experimentally.<br />Funding Agencies|National Natural Science Foundation of ChinaNational Natural Science Foundation of China (NSFC) [11874007, 12074076]

Details

Database :
OAIster
Notes :
English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1280624850
Document Type :
Electronic Resource
Full Text :
https://doi.org/10.1088.1674-1056.abe3e4