Cite
Investigation of defects and surface polarity in GaN using hot wet etching together with microscopy and diffraction techniques
MLA
Visconti, P., et al. Investigation of Defects and Surface Polarity in GaN Using Hot Wet Etching Together with Microscopy and Diffraction Techniques. 2002. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsoai&AN=edsoai.on1287593771&authtype=sso&custid=ns315887.
APA
Visconti, P., Visconti, P., Huang, D., Reshchikov, M. A., Yun, F., Cingolani, R., Smith, D. J., Jasinski, J., Swider, W., Liliental-Weber, Z., & Morkoc, H. (2002). Investigation of defects and surface polarity in GaN using hot wet etching together with microscopy and diffraction techniques.
Chicago
Visconti, P., P. Visconti, D. Huang, M.A. Reshchikov, F. Yun, R. Cingolani, D.J. Smith, et al. 2002. “Investigation of Defects and Surface Polarity in GaN Using Hot Wet Etching Together with Microscopy and Diffraction Techniques.” http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsoai&AN=edsoai.on1287593771&authtype=sso&custid=ns315887.