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Thiolate layers on metal sulphides characterised by XPS, ToF-SIMS and NEXAFS spectroscopy.
- Publication Year :
- 2008
-
Abstract
- Surface spectroscopic characterisation of some Cu and Ag thiolate multilayers on metal and metal sulphide substrates was undertaken to attempt to explain the undiminished floatability of sulphide minerals observed for collector coverage exceeding a monolayer. The thiol collectors investigated were dithiophosphate and 2-mercaptobenzothiazole (MBT), and bulk CuMBT and AgMBT complexes were prepared for comparison with the corresponding multilayers. The results suggested that the undiminished floatability of sulphide minerals with multilayer collector coverage can probably be attributed to the patch-wise nature of the multilayer.<br />Surface spectroscopic characterisation of some Cu and Ag thiolate multilayers on metal and metal sulphide substrates was undertaken to attempt to explain the undiminished floatability of sulphide minerals observed for collector coverage exceeding a monolayer. The thiol collectors investigated were dithiophosphate and 2-mercaptobenzothiazole (MBT), and bulk CuMBT and AgMBT complexes were prepared for comparison with the corresponding multilayers. The results suggested that the undiminished floatability of sulphide minerals with multilayer collector coverage can probably be attributed to the patch-wise nature of the multilayer.
Details
- Database :
- OAIster
- Notes :
- und
- Publication Type :
- Electronic Resource
- Accession number :
- edsoai.on1312637202
- Document Type :
- Electronic Resource