Experimental Characterization of the Fully Integrated Si-GaN Cascoded FET

MLA

Ren, Jie ECE, et al. Experimental Characterization of the Fully Integrated Si-GaN Cascoded FET. 2018. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsoai&AN=edsoai.on1331244607&authtype=sso&custid=ns315887.

APA

Ren, J. E., Tang, C. W., Feng, H., Jiang, H., Yang, W., Lau, K. M., & Sin, J. K. O. (2018). Experimental Characterization of the Fully Integrated Si-GaN Cascoded FET.

Chicago

Ren, Jie ECE, Chak Wah Tang, Hao Feng, Huaxing Jiang, Wentao Yang, Kei May Lau, and Johnny Kin On Sin. 2018. “Experimental Characterization of the Fully Integrated Si-GaN Cascoded FET.” http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsoai&AN=edsoai.on1331244607&authtype=sso&custid=ns315887.