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Elucidating proximity magnetism through polarized neutron reflectometry and machine learning

Authors :
Massachusetts Institute of Technology. Department of Materials Science and Engineering
Massachusetts Institute of Technology. Department of Mechanical Engineering
Massachusetts Institute of Technology. Department of Nuclear Science and Engineering
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Andrejevic, Nina
Chen, Zhantao
Nguyen, Thanh
Fan, Leon
Heiberger, Henry
Zhou, Ling-Jie
Zhao, Yi-Fan
Chang, Cui-Zu
Grutter, Alexander
Li, Mingda
Massachusetts Institute of Technology. Department of Materials Science and Engineering
Massachusetts Institute of Technology. Department of Mechanical Engineering
Massachusetts Institute of Technology. Department of Nuclear Science and Engineering
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Andrejevic, Nina
Chen, Zhantao
Nguyen, Thanh
Fan, Leon
Heiberger, Henry
Zhou, Ling-Jie
Zhao, Yi-Fan
Chang, Cui-Zu
Grutter, Alexander
Li, Mingda
Source :
American Institute of Physics (AIP)
Publication Year :
2022

Abstract

<jats:p> Polarized neutron reflectometry is a powerful technique to interrogate the structures of multilayered magnetic materials with depth sensitivity and nanometer resolution. However, reflectometry profiles often inhabit a complicated objective function landscape using traditional fitting methods, posing a significant challenge for parameter retrieval. In this work, we develop a data-driven framework to recover the sample parameters from polarized neutron reflectometry data with minimal user intervention. We train a variational autoencoder to map reflectometry profiles with moderate experimental noise to an interpretable, low-dimensional space from which sample parameters can be extracted with high resolution. We apply our method to recover the scattering length density profiles of the topological insulator–ferromagnetic insulator heterostructure Bi<jats:sub>2</jats:sub>Se<jats:sub>3</jats:sub>/EuS exhibiting proximity magnetism in good agreement with the results of conventional fitting. We further analyze a more challenging reflectometry profile of the topological insulator–antiferromagnet heterostructure (Bi,Sb)<jats:sub>2</jats:sub>Te<jats:sub>3</jats:sub>/Cr<jats:sub>2</jats:sub>O<jats:sub>3</jats:sub> and identify possible interfacial proximity magnetism in this material. We anticipate that the framework developed here can be applied to resolve hidden interfacial phenomena in a broad range of layered systems. </jats:p>

Details

Database :
OAIster
Journal :
American Institute of Physics (AIP)
Notes :
application/pdf, English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1351762084
Document Type :
Electronic Resource