Quality to rely on: meeting report of the 5th Meeting of External Quality Assessment, Naples 2016

Authors :: Krieken, H. van
Deans, S.
Hall, J.A.
Normanno, N.
Ciardiello, F.
Douillard, J.Y.
Krieken, H. van
Deans, S.
Hall, J.A.
Normanno, N.
Ciardiello, F.
Douillard, J.Y.
Source :: Esmo Open; e000114; 2059-7029; 5; 1; ~Esmo Open~e000114~~~~2059-7029~5~1~~
Publication Year :: 2016
Abstract: Contains fulltext : 171312.pdf (publisher's version ) (Open Access)

Database :: OAIster
Journal :: Esmo Open; e000114; 2059-7029; 5; 1; ~Esmo Open~e000114~~~~2059-7029~5~1~~
Publication Type :: Electronic Resource
Accession number :: edsoai.on1377157885
Document Type :: Electronic Resource

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