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Probabilistic Metric Embedding via Metric Labeling

Authors :
Kamesh Munagala and Govind S. Sankar and Erin Taylor
Munagala, Kamesh
Sankar, Govind S.
Taylor, Erin
Kamesh Munagala and Govind S. Sankar and Erin Taylor
Munagala, Kamesh
Sankar, Govind S.
Taylor, Erin
Publication Year :
2023

Abstract

We consider probabilistic embedding of metric spaces into ultra-metrics (or equivalently to a constant factor, into hierarchically separated trees) to minimize the expected distortion of any pairwise distance. Such embeddings have been widely used in network design and online algorithms. Our main result is a polynomial time algorithm that approximates the optimal distortion on any instance to within a constant factor. We achieve this via a novel LP formulation that reduces this problem to a probabilistic version of uniform metric labeling.

Details

Database :
OAIster
Notes :
application/pdf, English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1402194305
Document Type :
Electronic Resource
Full Text :
https://doi.org/10.4230.LIPIcs.APPROX.RANDOM.2023.2