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Probabilistic Metric Embedding via Metric Labeling
- Publication Year :
- 2023
-
Abstract
- We consider probabilistic embedding of metric spaces into ultra-metrics (or equivalently to a constant factor, into hierarchically separated trees) to minimize the expected distortion of any pairwise distance. Such embeddings have been widely used in network design and online algorithms. Our main result is a polynomial time algorithm that approximates the optimal distortion on any instance to within a constant factor. We achieve this via a novel LP formulation that reduces this problem to a probabilistic version of uniform metric labeling.
Details
- Database :
- OAIster
- Notes :
- application/pdf, English
- Publication Type :
- Electronic Resource
- Accession number :
- edsoai.on1402194305
- Document Type :
- Electronic Resource
- Full Text :
- https://doi.org/10.4230.LIPIcs.APPROX.RANDOM.2023.2