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Lithographic thin–film structures based on Electrochromic materials: Case study by scanning probe microscopy
- Publication Year :
- 2022
-
Abstract
- The main object of this study will be based on producing and characterization of lithographic thin–film structures produced based electrochromic materials. Atomic force microscopy will be used as a main method of evaluation the morphology of lithographic structures. The optical properties of eslectrochromic materials will be analyze using scanning near–field optical microscopy by applying different electrical potential.
Details
- Database :
- OAIster
- Notes :
- English
- Publication Type :
- Electronic Resource
- Accession number :
- edsoai.on1427105287
- Document Type :
- Electronic Resource