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Scanning Transmission X-Ray Microscopy as a Novel Tool to Probe Colloidal and Photonic Crystals

Authors :
van Schooneveld, Matti M.
Hilhorst, Jan
Petukhov, Andrei V.
Tyliszczak, Tolek
Wang, Jian
Weckhuysen, Bert M.
de Groot, Frank M. F.
de Smit, Emiel
van Schooneveld, Matti M.
Hilhorst, Jan
Petukhov, Andrei V.
Tyliszczak, Tolek
Wang, Jian
Weckhuysen, Bert M.
de Groot, Frank M. F.
de Smit, Emiel
Source :
Small: nano micro vol.7 (2011) date: 2011-03-20 nr.6 p.804-811 [ISSN 1613-6810]
Publication Year :
2011

Abstract

Photonic crystals consisting of nano-to micrometer-sized building blocks, such as multiple sorts of colloids, have recently received widespread attention. It remains a challenge, however, to adequately probe the internal crystal structure and the corresponding deformations that inhibit the proper functioning of such materials. It is shown that scanning transmission X-ray microscopy (STXM) can directly reveal the local structure, orientations, and even deformations in polystyrene and silica colloidal crystals with 30-nm spatial resolution. Moreover, STXM is capable of imaging a diverse range of crystals, including those that are dry and inverted, and provides novel insights complementary to information obtained by benchmark confocal fluorescence and scanning electron microscopy techniques.

Details

Database :
OAIster
Journal :
Small: nano micro vol.7 (2011) date: 2011-03-20 nr.6 p.804-811 [ISSN 1613-6810]
Notes :
DOI: 10.1002/smll.201001745, English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1445778695
Document Type :
Electronic Resource