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An analog cell to detect single event transients in voltage references
- Publication Year :
- 2015
-
Abstract
- © 2015 Elsevier.<br />A reliable voltage reference is mandatory in mixed-signal systems. However, this family of components can undergo very long single event transients when operating in radiation environments such as space and nuclear facilities due to the impact of heavy ions. The purpose of the present paper is to demonstrate how a simple cell can be used to detect these transients. The cell was implemented with typical {COTS} components and its behavior was verified by {SPICE} simulations and in a laser facility. Different applications of the cell are explored as well.<br />Ministerio de Educación y Ciencia<br />Universidad Complutense de Madrid<br />Banco Santander<br />Depto. de Estructura de la Materia, Física Térmica y Electrónica<br />Depto. de Química Física<br />Fac. de Ciencias Físicas<br />Fac. de Ciencias Químicas<br />TRUE<br />pub
Details
- Database :
- OAIster
- Notes :
- application/pdf, 0168-9002, English
- Publication Type :
- Electronic Resource
- Accession number :
- edsoai.on1450535997
- Document Type :
- Electronic Resource