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Type I Error Rates for Generalized Graded Unfolding Model Fit Indices
- Source :
-
Applied Psychological Measurement . Jan 2004 28(1):48-71. - Publication Year :
- 2004
-
Abstract
- Type I error rates were examined for several fit indices available in GGUM2000: extensions of Infit, Outfit, Andrich's X(2), and the log-likelihood ratio X(2). Infit and Outfit had Type I error rates much lower than nominal alpha. Andrich's X(2) had Type I error rates much higher than nominal alpha, particularly for shorter tests or larger sample sizes. The log-likelihood X(2) had Type I error rates near or below nominal alpha for small samples or longer tests but had inflated error rates with large samples and shorter tests. For conditions in which the log-likelihood ratio X(2) did not perform well, alternative fit indices or modifications to these procedures should be considered in future studies.
Details
- Language :
- English
- ISSN :
- 0146-6216
- Volume :
- 28
- Issue :
- 1
- Database :
- ERIC
- Journal :
- Applied Psychological Measurement
- Publication Type :
- Academic Journal
- Accession number :
- EJ689699
- Document Type :
- Journal Articles<br />Reports - Evaluative
- Full Text :
- https://doi.org/10.1177/0146621603259901