Previous
Next
Journal
- microelectronics reliability17
- ieee transactions on reliability15
- reliability, yield, and stress burn-in : a unified approach for microelectronics systems manufacturing & software development12
- ieee transactions on semiconductor manufacturing10
- 2016 china semiconductor technology international conference (cstic)6
- reliability, yield, and stress burn-in6
- 2015 annual reliability & maintainability symposium (rams)4
- 2015 annual reliability and maintainability symposium (rams)4
- 2015 ieee 22nd international symposium on the physical & failure analysis of integrated circuits3