1. Improved and accurate physics-of-failure (PoF) methodology for qualification and lifetime assessment of electronic systems.
- Author
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Temsamani, A.B., Kauffmann, S., Descas, Y., Vandevelde, B., Zanon, F., and Willems, G.
- Subjects
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RELIABILITY of electronics , *ELECTRONIC systems , *FAILURE analysis , *POWER electronics , *PREDICTION models - Abstract
Assessing electronic systems' reliability using prediction handbooks (e.g. MIL-HDBK-217) can lead to wrong reliability predictions due to the assumption of a constant failure rate and the inaccuracy of the proposed semi-empirical models. Despite different initiatives since the last version of the most popular handbook MIL-HDBK-217 (1995) no fundamental improvement was realised that makes use of non-constant failure rate statistics – mandatory to model wear-out - and first principles based Physics-of-Failure modelling. Obtaining detailed PoF models requires physical insights and an extended experimental campaign to establish material properties. This is impossible to perform for a specific application. In this paper, we propose a methodology that combines the two approaches to get an improved reliability estimation and allows for a gradual improvement from a prediction handbook based approach to a PoF based reliability assessment. This methodology has been successfully validated on an industrial case. [ABSTRACT FROM AUTHOR]
- Published
- 2017
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