1. Magnetic Domain and Structural Defects Size in Ultrathin Films.
- Author
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Adanlété Adjanoh, Assiongbon, Pakam, Tchilabalo, and Afenyiveh, Serge Dzo Mawuefa
- Subjects
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MAGNETIC domain walls , *THIN films , *MAGNETIC domain , *BUFFER layers , *MAGNETIC measurements , *PERPENDICULAR magnetic anisotropy - Abstract
Herein, a model is proposed for measuring the structural defects size
r 0 in an ultrathin magnetic layer with perpendicular magnetic anisotropy. Based on the observations of magnetic domains in Ta/Pt/Co/Pt ultrathin films, using polar magneto‐optical Kerr effect microscopy and measurements of their magnetic anisotropies, the correlation between magnetic domains sizeD and structural defects sizer 0, as well as the defects concentration parameterα K, which designates the degree of pinning, has been modeled. The averager 0 value found is high in the sample with unannealed buffer layers and considerably decreases with annealing. It is 6.17 nm with unannealed Ta/Pt buffer layers, 1.06 nm in sample with Ta/Pt buffer layers annealed at 423 K, and 0.49 nm in that with buffer layers annealed at 573 K. The significant drop ofr 0 is in good agreement with the high depinning noted with buffer layers annealing in recent work. [ABSTRACT FROM AUTHOR]- Published
- 2024
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