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1. Experimental method to thermally deembed pads from R[sub TH] measurements

Author

James Chingwei Li, Hitko, Donald A., Sokolkich, Marko, and Asbeck, Peter M.

Subjects
Bipolar transistors -- Design and construction, Bipolar transistors -- Thermal properties, Indium -- Thermal properties, Indium -- Electric properties, Semiconductor device, Business, Electronics, Electronics and electrical industries
Abstract

Test structures with various width metal traces between the emitter pad and the device's emitter are fabricated in a 200-GHz InP double heterojunction bipolar transistor (HBT) process. A method of using the measured thermal resistance (R[sub TH]) of these structures and a simple resistive network model to deembed the pads is presented.

Published
2006

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