Author: "Chien, Wei-Ting Kary" / Journal: 2015 ieee 22nd international symposium on the physical & failure analysis of integrated circuits - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Chien, Wei-Ting Kary"' showing total 3 results

Start Over Author "Chien, Wei-Ting Kary" Journal 2015 ieee 22nd international symposium on the physical & failure analysis of integrated circuits

3 results on '"Chien, Wei-Ting Kary"'

1. Gate oxide reliability improvement for UMOS technology.

Author: Niu, Gang, Chien, Wei-Ting Kary, Zhang, Guan, Yu, Jianshu, Zhao, Xiaodong, and Duan, Xiaobo
Published: 2015
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2. An investigation on the high temperature dependence of the HCI on NMOSFET transistor.

Author: Zhao, Xiaodong, Chien, Wei-Ting Kary, Zhang, Guan, Yu, Jianshu, Niu, Gang, and Duan, Xiaobo
Published: 2015
Full Text: View/download PDF

3. Sample preparation DOE for the die pull test.

Author: Chen, Xiali, Chien, Wei-ting Kary, Zhang, Guan, Zhao, Yong, Cheng, Bo, and Zhao, Hong E
Published: 2015
Full Text: View/download PDF

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