1. Control of coercivity of iron films deposited on porous silicon substrates
- Author
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Xiong Zu-Hong, Chen Peng, Liu Guo-Lei, He Zheng-Hong, Qiu Xue-Jun, Bai Lang, Wang Yue, and Zhang Yun-Peng
- Subjects
Materials science ,General Physics and Astronomy ,Substrate (electronics) ,Coercivity ,Porous silicon ,law.invention ,Hysteresis ,Crystallography ,law ,Sputtering ,Cavity magnetron ,Scanning tunneling microscope ,Composite material ,Porosity - Abstract
Porous silicon (PS) with different porosity was obtained by anode electrochemical etching of boron-doped Si (100); the as-etched samples were then covered with Fe films by magnetron sputter technique. Analysis of surface profile and structural investigation were done by scanning tunneling microscopy and X-ray diffraction. Magneto-optical Kerr effect was employed to measure the hysteresis loops of the iron films sputtered onto PS and the reference sample on the Si substrate. The coercivity of the PS-based Fe films is larger than that of the Si-based ones, and increases with the porosity of the PS substrate. As for the PS-based samples with the same porosity, the coercivity of Fe films decreases with their thicknesses in a certain range. We found that the spongelike structure of PS can be effectively used to control the coercivity of iron films on the PS substrates.
- Published
- 2006