7 results on '"Wang, Xiaohu"'
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2. Study on the single-event burnout mechanism of p-GaN gate AlGaN/GaN HEMTs.
3. Synergistic effect of electrical bias and proton irradiation on the electrical performance of β-Ga2O3 p–n diode.
4. Study on the single-event burnout mechanism of GaN MMIC power amplifiers.
5. Modeling the conduction mechanisms of intrinsic multi-level states in HfOx-based resistive random access memory
6. Investigation on the threshold voltage instability mechanism of p-GaN gate AlGaN/GaN HEMTs under high-temperature reverse bias stress
7. Modeling the conduction mechanisms of intrinsic multi-level states in HfOx-based resistive random access memory.
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