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Start Over Author "Liu, Zhuang" Journal applied physics letters Publisher american institute of physics

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1 results on '"Liu, Zhuang"'

1. Shear-force atomic force microscope by using the second resonance regime of tuning fork probe.

Author

Liu, Zhuang, Zhang, Ying, Kok, Shaw Wei, Ng, Boon Ping, and Soh, Yeng Chai

Subjects
*SHEAR (Mechanics), *FORCE & energy, *ATOMIC force microscopy, *IMAGING systems, *SENSITIVITY analysis, *TUNING forks
Abstract

An imaging scheme of shear-force atomic force microscope is proposed by exploiting the second resonance regime of the tuning fork probe. Theoretical analysis and experimental results demonstrate that the imaging scheme can deliver better sensitivity and higher resolution of topographic imaging. [ABSTRACT FROM AUTHOR]

Published
2010
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