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The thermal expansion of as-prepared and annealed silver nanowires embedded in anodic alumina membranes with different diameters was studied by in situ x-ray diffraction in the temperature range from 25 to 800 °C. For both the as-prepared and annealed samples, the coefficients of thermal expansion have “V” shape change as the diameters increase; and the minimum values of the coefficients of thermal expansion do not correspond to the same diameters of nanowires. The collective effects of the surface tension, the limit effects of anodic alumina membrane, and the vacancies incorporated into the silver lattice were responsible for the thermal expansion. [ABSTRACT FROM AUTHOR]

Thermal expansion of as-prepared and annealed ordered arrays of silver nanowires embedded in anodic alumina membranes (AAMs) was studied by in situ x-ray diffraction measurement in the temperature range from 25 to 800 °C. The axial thermal expansion coefficient (TEC) for the as-prepared nanowires is 6.35×10-9/°C and 6.02×10-6/°C below and above 650 °C, respectively. However, the TEC of the annealed sample turns from 2.32×10-6/°C to 12.06×10-6/°C when the temperature is above 350 °C. The collective effects of the intrinsic expansion, surface pressure, the limit effect of AAM, and the vacancies incorporated into the silver lattice were responsible for the thermal expansion. [ABSTRACT FROM AUTHOR]