1. A digital CDS technique and its performance testing
- Author
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Yong Chen, Zi-Liang Zhang, Juan Wang, Yanji Yang, Guo-He Yin, Ke-Yan Ma, Mao-Shun Li, Yi Zhang, Yu-Sa Wang, Tian-Xiang Chen, Jingbin Lu, Bo Lu, Wei-Wei Cui, Jia Huo, Y. L. Zhang, Yan-Hong Fu, Da-Wei Han, Wei Hu, Xiao-Yan Liu, Wei Li, Yue Zhu, Yu Wang, Yupeng Xu, and Zhong-Yi Zhao
- Subjects
Physics ,Nuclear and High Energy Physics ,Correlated double sampling ,Noise (signal processing) ,Numerical analysis ,Astronomy and Astrophysics ,Signal ,law.invention ,Data acquisition ,Critical parameter ,law ,ComputingMethodologies_SYMBOLICANDALGEBRAICMANIPULATION ,Operational amplifier ,Electronic engineering ,Instrumentation ,Energy (signal processing) ,MathematicsofComputing_DISCRETEMATHEMATICS - Abstract
Readout noise is a critical parameter for characterizing the performance of charge-coupled devices (CCDs), which can be greatly reduced by the correlated double sampling (CDS) circuit. However, a conventional CDS circuit inevitably introduces new noise since it consists of several active analog components such as operational amplifiers. This paper proposes a digital CDS circuit technique, which transforms the pre-amplified CCD signal into a train of digital presentations by a high-speed data acquisition card directly without the noisy CDS circuit, then implements the digital CDS algorithm through a numerical method. A readout noise of 3.3 e(-) and an energy resolution of 121 eV@5.9 keV can be achieved via the digital CDS technique.
- Published
- 2015
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