26 results on '"Groeseneken, Guido"'
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2. High-k Characterization by RFCV
3. Instability and Defects in Gate Dielectric: Similarity and Differences Between Hf-Stacks and SiO2
4. A Step Towards a Better Understanding of Silicon Passivated (100)Ge p-Channel Devices
5. Novel Device Concepts for Nanotechnology: The Nanowire Pinch-Off FET and Graphene TunnelFET
6. CARBonCHIP: Carbon Nanotubes Technology on Silicon Integrated Circuits; Some Key Results
7. Tunnel Field-Effect Transistors for Future Low-Power Nano-Electronics
8. Trends and Challenges in Si and Hetero-Junction Tunnel Field Effect Transistors
9. (Invited) Reliability of SiGe Channel MOS
10. (Invited) Boosting the On-Current of Si-Based Tunnel Field-Effect Transistors
11. Integration of Vertical Carbon Nanotube Bundles for Interconnects
12. Trapping in 1nm EOT high-k / MG
13. Formation of Porous Alumina Patterns on Silicon
14. Toward Understanding the Wide Distribution of Time Scales in Negative Bias Temperature Instability
15. Nucleation and Growth Study of Nickel Nanoparticles on Silicon.
16. NBTI Study on PMOS Devices with TiN/HfO2 Gate Stack and Process Induced Strain
17. Hf Cap Thickness Dependence in Bipolar-Switching TiN\HfO2\Hf\TiN RRAM Device
18. Trends and Challenges in Si and Hetero-Junction Tunnel Field Effect Transistors
19. Novel Device Concepts for Nanotechnology: The Nanowire Pinch-Off FET and Graphene TunnelFET
20. Tunnel Field-Effect Transistors for Future Low-Power Nano-Electronics
21. High-k Characterization by RFCV
22. Instability and Defects in Gate Dielectric: Similarity and Differences Between Hf-Stacks and SiO2
23. A Step Towards a Better Understanding of Silicon Passivated (100)Ge p-Channel Devices
24. Interface Trap Characterization and Fermi Level Pinning in Si-Passivated Ge/HfO2 Capacitors
25. Hf Cap Thickness Dependence in Bipolar-Switching TiN\HfO2\Hf\TiN RRAM Device
26. CARBonCHIP: Carbon Nanotubes Technology on Silicon Integrated Circuits; Some Key Results
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