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Your search keyword '"Rosenbaum, Elyse"' showing total 2 results
Start Over Author "Rosenbaum, Elyse" Journal electronic device failure analysis
2 results on '"Rosenbaum, Elyse"'

1. DATA-DRIVEN RELIABILITY FOR DATACENTER HARD DISK DRIVES.

Author

Yang, Alan, Ghassami, AmirEmad, Rosenbaum, Elyse, and Kiyavash, Negar

Subjects
*RELIABILITY in engineering, *TELEMETRY, *INFORMATION retrieval, *DETECTORS, *HARDWARE
Abstract

The article focuses on the study of the data driven reliability focused on hard disk drives of data centers. It mentions that reliability is a concern in hardware design. It mentions that telemetry and data storage technologies have enabled diagnostic sensor arrays to be embedded in the hardware systems. It mentions that system designers collect sensor data streamed from operational devices.

Published
2019
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2. BETTER PERFORMANCE, HIGHER RELIABILITY, MORE SECURITY: RESEARCH HIGHLIGHTS FROM THE CENTER FOR ADVANCED ELECTRONICS THROUGH MACHINE LEARNING.

Author

Aysu, Aydin, Xu Chen, Davis, W. Rhett, Sung Kyu Lim, Franzon, Paul, Swaminathan, Madhavan, and Rosenbaum, Elyse

Subjects
*MACHINE learning, *INTEGRATED circuit design, *GENERATIVE adversarial networks, *MONTE Carlo method, *SIGNAL integrity (Electronics), *ELECTRONIC equipment
Abstract

The article reports that The Center for Advanced Electronics through Machine Learning, or CAEML, is an IndustryUniversity Cooperative Research Center (IUCRC) supported by the National Science Foundation. The IUCRC program supports pre-competitive research that is of high interest to industry. CAEML's research mission is to utilize machine learning for the design of optimized microelectronic circuits and systems and to increase the efficiency of electronic design automation.

Published
2022

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