1. Universal test set for detecting stuck-at and bridging faults in double fixed-polarity Reed–Muller programmable logic arrays.
- Author
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Rahaman, H. and Das, D.K.
- Subjects
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PROGRAMMABLE logic devices , *ELECTRONIC circuit design , *AUTOMATIC test equipment , *LOGIC devices , *FIELD programmable gate arrays , *NETWORK processors , *ELECTRONIC circuits , *ELECTRONICS , *INTEGRATED circuits - Abstract
A testable design for detecting stuck-at and bridging faults in programmable logic arrays (PLAs) based on double fixed-polarity Reed–Muller (DFPRM) expression is presented. DFPRM expression has the advantage of compactness and easy testability. The EXOR part in the proposed structure is designed as a tree of depth (⌈log2s⌉+1), where s is the number of product terms and sum terms in the given DFPRM expression realised by PLAs. This solves an open problem of designing an EXOR-tree-based RMC network that admits a universal test set. For an n-variable function, a test sequence of length (2n+8) vectors is sufficient to detect all single stuck-at and bridging faults in the proposed design. The proposed EXOR-tree-based network reduces circuit delay significantly compared with cascaded EXOR-based design. The test sequence is independent of the function and the circuit-under-test, and the test set can be stored in a ROM for built-in-self-test. [ABSTRACT FROM AUTHOR]
- Published
- 2006
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