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Testing multimodule systems presents several challenges, particularly when systems use submicron technology. The authors propose strategies to diagnose interconnect faults in bus-structured systems using several models. We propose several methods and strategies for a diagnosis using different fault models, including those applicable to submicron technology. Besides defining new features, such as the logical extent of faults, we also propose a reduction strategy that permits 100% fault detection and identification (including fault location).

This approach uses the criterion of equivalent classes to establish the equivalence between two circuits and designs. Combining simulation and automatic test pattern generation, it exploits similarities among designs to assess logical equivalence quickly and reliably.