1. On-Die Power Supply Noise Measurement Techniques.
- Author
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Alon, Elad, Abramzon, Valentin, Nezamfar, Bita, and Horowitz, Mark
- Subjects
- *
ELECTRIC power , *NOISE measurement , *ELECTRONICS , *COMPUTER input-output equipment , *ANALOG-to-digital converters - Abstract
This paper presents techniques for characterizing wide-band on-chip power supply noise using only two on-chip low-throughput samplers. The properties of supply noise and their associated measurement techniques are reviewed to show how this can be achieved. An initial design of the samplers uses high-resolution VCO-based analog-to-digital converters, and experimental results from a test-chip verify the efficacy of the measurement techniques. To enable simple sampler designs to be used even in aggressively scaled process technologies, measurement systems based on dithered low-resolution samplers are also developed and experimentally characterized. [ABSTRACT FROM AUTHOR]
- Published
- 2009
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