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This paper presents an overview for low-power successive approximation register (SAR) analog-to-digital converters (ADCs). It covers the operation principle, error analysis, and practical design issues. Furthermore, this paper provides a comprehensive survey of state-of-the-art low-power design techniques for every circuit block in the SAR ADC, including comparator, capacitive digital-to-analog converter (DAC), and SAR logic. The goal of this paper is to provide a useful overview to SAR ADC designers who want to improve the energy efficiency targeting low-to-medium speed applications. [ABSTRACT FROM AUTHOR]

This paper presents a 1.5-GS/s 6-bit single-channel loop-unrolled successive approximation register (SAR) analog-to-digital converter (ADC) using speculative capacitive DAC (CDAC) switching control technique. The proposed SAR ADC achieves a high sampling rate by eliminating additional delays in typical loop-unrolled SAR ADCs related to settling time constraints in their CDACs. Specifically, the CDACs are duplicated and controlled in speculative ways so that the CDAC outputs passage to their next values before completing the regeneration operation of comparators, thereby improving timing constraints for successive approximations. The switching power overhead from the CDAC speculation is mitigated by introducing an energy-efficient CDAC control technique that produces desired voltage transients with minimal power overheads. The prototype of the proposed SAR ADC is fabricated in a 28-nm CMOS technology and occupies an active area of 0.0038-mm2. The design consumes 5.8 mW from a 1.2-V supply. The ADC achieves 1.5-GS/s sampling frequency with a 31-dB SNDR at a low input frequency and a 28.6 dB at the Nyquist frequency without applying any offset calibration techniques, achieving the highest sampling frequency among the 6-bit single-channel loop-unrolled SAR ADCs reported. [ABSTRACT FROM AUTHOR]

In this paper, a single-channel two-step voltage-time hybrid domain analog-to-digital converter (ADC) is proposed. To achieve high sampling rate and high accuracy, 3.5-bit voltage domain MDAC and 7-bit high-speed time domain ADC (TD-ADC) are combined into a 10-bit hybrid ADC. In the first stage MDAC, a low-power push-pull amplifier is used to improve settling speed, and 1-bit redundancy is designed for calibration and dither injection. The TD-ADC with selective time domain quantization is implemented by a constant-current voltage to time converter (VTC) array and a direct positive feedback time domain comparator. The proposed VTC array can maintain high linearity with a large input swing in high-speed application. The prototype ADC was fabricated in a 28-nm CMOS process and occupied a core area of 0.074 mm2. Under a 0.95-V power supply, the chip achieves a measured peak SNDR of 53.2 dB and SFDR of 61.7 dB respectively at conversion rate up to 2.5 GS/s. The FOM is 48.2 fJ/conversion-step. [ABSTRACT FROM AUTHOR]

Digital Storage Oscilloscopes (DSOs) conjugate high performance with large number of features and flexibility. The basic structure, based on fast Analog to Digital Converter (ADC) and memory, is augmented with several components for channel matching and bandwidth improvement, and processors that provide visualization, frequency processing, jitter and stability measurement, etc. Unfortunately, fine resolution in sample rate selection is not available, such that for several applications the user must run complex measurement procedures that require data download and offline processing. The paper proposes a dedicated digital circuit that offers fine control of the time-base by real time downsampling the input stream at an almost arbitrary sampling rate. The proposed circuit implements a series of operations involving real-time data filtering, defragmentation and packing, which are not considered by alternative approaches, like those based on polyphase filters, that offer very limited choices for the sampling rate. The circuit is designed to work in conjunction with the highest performance DSOs that use a multichannel architecture. Design rules for circuit design are provided together with implementation results in 14nm FinFET technology. When designed for an architecture with 64 channels with 8bit input samples the circuit works in real time with a sampling rate of 220 GSps running at 3.42 GHz, with a silicon footprint of 0.17 mm2 and a power dissipation of 0.85W. [ABSTRACT FROM AUTHOR]

This paper presents a digital readout integrated circuit (DROIC) for small pitch medium-wave infrared (MWIR) starring focal plane arrays (FPAs). To overcome the limited in-pixel resolution of such DROICs, the concept of error shaping is introduced in pulse frequency modulation (PFM)-based pixels. Multiple integration operations are performed in a single frame and the residue charge from each integration phase is retained and injected into the next charge packet. This over-integration routine provides a high pass noise transfer function (NTF) equivalent to what is obtained in a first order sigma delta modulator. The concise structure of a PFM analog-to-digital converter (ADC) lends itself well to such an operation inside the pixel, while consuming low power. Along with a theoretical analysis of the technique, a prototype based on a $16\times 16$ array and sinc decimation filters is developed to demonstrate the performance of the proposed DROIC. With an in-pixel resolution of 5 bits and over-integration ratio (OIR) of 128, 395 noise electrons are demonstrated at full-well fill from the test array fabricated in a 90 nm bulk-CMOS process. [ABSTRACT FROM AUTHOR]

In this paper, the implementation on a Field Programmable Gate Array (FPGA) of Relaxation Digital to Analog Converters (ReDACs), which take advantage of the impulse response of a first-order RC network to generate and combine binary weighted voltages, is addressed. For this purpose, the dominant ReDAC nonlinearity limitation related to the parasitics of the RC network is analyzed and a simple and robust technique for its effective suppression is proposed. Moreover, a ReDAC foreground digital calibration strategy suitable to FPGA implementation is introduced to tune the clock frequency of the converter, as requested for ReDAC operation. The novel error suppression technique and calibration strategy are finally implemented on a 13-bit, 514 S/s prototype (ReDAC1) and on a 11-bit, 10.5 kS/s prototype (ReDAC2), which are experimentally characterized under static and dynamic conditions. Measured results on ReDAC1 (ReDAC2) reveal 1.68 LSB (1.53 LSB) maximum INL, 1.54 LSB (1.0 LSB) maximum DNL, 76.4 dB (67.9 dB) THD, 79.7 dB (71.4 dB) SFDR and 71.3 dB (63.3 dB) SNDR, corresponding to 11.6 (10.2) effective bits (ENOB). [ABSTRACT FROM AUTHOR]

As new applications impose jitter values in the range of a few tens of femtoseconds, the design of phase-locked loops faces daunting challenges. This paper derives basic relations between the tolerable jitter and the power consumption, predicting severe issues as jitters below 10 fs are sought. The results are also applied to the sampling clocks in analog-to-digital converters and suggest that clock generation may consume a greater power than the converter itself. [ABSTRACT FROM AUTHOR]

This paper introduces a 12 bit 2.5 bit/cycle SAR-based pipeline ADC employing a self-bias gain boosting amplifier. The single-stage amplifier achieves a low-frequency gain of 37 dB, while consuming 1.3 mW of power consumption with 1.3 V of analog power supply. A 2.5 bit/cycle SAR ADC realizes as the sub-ADC in each stage, and reduces both power consumption and silicon area. A two-channel sampling architecture is employed to double the sampling rate and thereby maximize circuit efficiency. A digital calibration technique is used to reduce non-linearity and mismatches due to the RDAC, as well as gain error and offset of the open-loop residue amplifier. The prototype ADC was fabricated in TSMC 40-nm technology, and consumes 10.71 mW with 1.1 V / 1.3 V digital / analog power supplies. When operating at 125 MS/s, the ADC achieves an SFDR of 66.59 dB before calibration and 80.3 dB after calibration when measured at Nyquist frequency. The experimental results show a Walden FoM of 101 fJ/c.-s. before calibration and 47 fJ/c.-s. after calibration. [ABSTRACT FROM AUTHOR]

This paper presents an area-efficient design of a column-parallel second-order digital decimation filter for a $\Sigma \Delta$ analog-to-digital converter-based CMOS image sensor. By using the proposed pre-bitwise-inversion topology having the same mathematical function, the chip area could be curtailed, where the bit-wise-inversion block, required by the correlated-double-sampling, is moved to the front of the adder. Following such a technique as this, more than six inverters and multiplexers can be reduced. This paper also proposes an adder scheme with only 118 transistors to implement the 13-bit dynamic range integrator. Moreover, the number of MSB cells inside the ripple counter is optimized to balance leakage current and active power consumption. Compared with the prior art, the proposed decimation filter core (without registers) can achieve a reduction of about 24% in transistor count. The proposed design is implemented with a 130-nm standard CMOS process. The total chip area of the digital decimation filter is only $4.5\times 145~\mu \text{m}^{2}$ per column, which is less than half area compared against the prior art. According to the post-layout simulation, the maximum operating frequency is 124 MHz, and the total power consumption, including the filter core and 13-bit registers, is less than 6.35 $\mu \text{W}$ under a typical 50-MHz clock frequency. [ABSTRACT FROM AUTHOR]

This paper presents a novel technique for single slope analog to digital converter (SSADC) to suppress the row-wise noise in CMOS image sensor. A sample switch is used in the current-steering DAC to reduce the noise introduced by bias circuits, which will deteriorate the characteristic of uniformity in the row direction. The sample switch can fix the voltage which biases the current source in the current-steering DAC when generating a ramp to avoid the ramp fluctuation in the time domain. The digital correlated double sampling is used to reduce the non-uniformity in column-level ADCs. The CMOS image sensor prototype is fabricated in 110nm 1P3M process. The 10-bit SSADC achieves DNL of −0.20 / +0.15 LSB and INL of −1.35 / +0.91 LSB at a sampling frequency of 29.2 KHz. It is proved that the row-wise noise is reduced from $764~\mu {\mathrm {V}}_{\text {rms}}$ to 163 $\mu {\mathrm {V}}_{\text {rms}}$ at a frame rate of 228 fps using the proposed sample switch structure. The prototype photos taken by the sensor show that the row-wise noise is reduced under the low-illumination circumstance effectively. [ABSTRACT FROM AUTHOR]

This paper presents a multi-mode, dynamically zooming analog to digital converter (ADC). The architecture is based on a 5b interpolating flash ADC as the zooming unit and a passive discrete-time $\Delta \Sigma $ modulator as the fine conversion unit. The proposed ADC provides a dynamic zooming technique, employing an interpolating zooming front-end. The modulator covers between 0.1 MHz and 10 MHz signal bandwidth which makes it suitable for cellular applications including 4G radio systems. By reconfiguring the OSR, bias current, and component parameters, optimal power consumption can be achieved for every mode. The ADC is implemented in $0.13~\mu \text{m}$ CMOS technology and it achieves an SNDR of 83/75.7/73.2/67 dB for 0.1/1.92/5/10MHz bandwidth with 1.3/4.7/8.1/10.3mW power consumption from a 1.2 V supply. [ABSTRACT FROM AUTHOR]

This paper presents a 4-b phase-domain analog-to-digital converter (ADC) that utilizes the time-domain reference generation scheme for low-power operation. Rather than prior arts that rely on power-hungry resistive/current combiners or the IQ-assisted binary-search algorithm with large power T&H circuits for the reference generation, this design benefits from the fully dynamic power characteristic of the time-domain operation, thus leading to an energy-efficient phase ADC design. By introducing several on-chip calibration techniques, the design achieves good robustness with the proposed time-domain operation. The prototype is fabricated in the standard 65-nm CMOS technology, achieving an ENOB of 3.42 bits at 1 MS/s with near Nyquist input, while dissipating $7~\mu \text{W}$ from a 1-V supply. It leads to a 1.36-pJ/conversion-step Walden Figure of Merit at Nyquist input (FoM@Nyquist). [ABSTRACT FROM AUTHOR]

This paper presents a highly linear BiCMOS sample and hold amplifier (SHA) providing 2.8-GS/s intermediate frequency (IF) sampling for a 1-GHz input bandwidth spanning from 1.5 to 2.5 GHz. A single-transistor hold-mode feedthrough cancellation technique is implemented to remove distortion resulting from the nonlinear parasitic capacitance at the sampling node. The SHA is designed in a mainstream 130-nm BiCMOS technology using SiGe heterojunction bipolar transistors to buffer and sample the wideband input. The proposed SHA enables monolithic integration with a high-speed analog-to-digital converter core to realize a high-performance converter solution. This independent sampling front end occupies a core chip area of 0.6 mm2 and consumes an average power of 1.26 W. The SHA is a pseudo-differential open-loop design that includes two cascaded track-and-hold amplifiers, a high-speed clock driver, and externally adjustable current mirror biases. The high-speed clock drivers and buffers add 170 mW to the total power consumption. The measurements of the fabricated SHA show a 10-bit effective resolution across the 1-GHz IF bandwidth and < −61-dBc HD2 and HD3. [ABSTRACT FROM AUTHOR]

Incremental analog-to-digital-converters (IADCs) are variants of $\triangle \Sigma $ ADCs, which have been increasingly used for low-power sensory applications in recent years. Most IADC applications require high resolution and high energy efficiency. In this paper, we present a systematic analysis of IADCs. We derive analytical design equations for practical IADC designs. Process limitations are included in the model as well. The equations are verified with a 14-bit second-order IADC design in a 0.18- $\mu \text{m}$ process. With the design equations, the theoretical energy efficiency bound is derived for IADCs. The efficiency bound is compared with previously reported IADC designs. It is found that the derived bound matches existing designs well. [ABSTRACT FROM AUTHOR]

This paper presents a 5-GS/s 12-way 10-b time-interleaved successive approximation register (SAR) ADC for direct sampling receivers. Proper signal and clock distribution along the multiple channels are utilized to mitigate interchannel bandwidth and timing mismatches. A digitally assisted calibration is introduced to remove the interchannel offset, gain, and timing mismatch. The T-type bootstrapped sampling switches minimize the interchannel crosstalk among top-plate sampling SAR channels and the signal-dependent leakage current during SAR conversion cycles. The power efficiency of this ADC is significantly improved by many design techniques. The merged capacitor switching algorithm leads to high switching efficiency and a smaller area. The modified reference voltage scheme optimizes input common-mode voltage of the comparators. The optimal subradix-2 capacitive DAC results in low-power reference buffers and higher conversion speed. This ADC achieves 49-dB SNR, 52-dB THD, and 42-dB SNDR up to Nyquist frequency at 5 GS/s, consumes 76 mW from 1 V supply, and occupies 0.57 mm $^{{ {2}}}$ in 28 nm CMOS technology. The implemented architecture also demonstrates high scalability to advanced CMOS technology nodes and has even higher power efficiency potential. [ABSTRACT FROM AUTHOR]

Noise analysis of the ramp reference voltage and its projection at the output of a conventional single-slope ramp analog-to-digital converter (ADC) is presented. This paper gives insight on the reference voltage noise origins during the continuous-time ramping phase of column-parallel CMOS image sensor ADCs, as well as its effect on the final ADC output noise. Theoretical modeling of an occurring random walk noise on continuous-time-based ramp references is presented first. Noise on the ramp does not directly add to the output noise of the ADC, but it is modulated and projected subject to given ramp rise time conditions. Test measurements show that the signal-dependent output noise is consistent with the rate of noise increase by the proposed random walk noise model. [ABSTRACT FROM AUTHOR]

This paper presents a low-power fully digital clock skew feedforward background calibration technique in sub-sampling Time-Interleaved Analog-to-Digital Converters (TIADCs). Both estimation and correction algorithms share the common derivative filter, which makes them possible to reduce the chip area. Furthermore, these algorithms use the polyphase filtering technique and do not use adaptive digital synthesis filters. Thus, the proposed calibration can be implemented on a moderate hardware cost with low power dissipation. The adopted feedforward technology eliminates the stability issues encountered with the adaptive technique. The Hardware Description Language (HDL) design of the proposed calibration is synthesized using a 28nm FD-SOI process for a 60dB SNR TIADC clocked at 2.7GHz. The calibration is designed for both baseband and sub-sampling TIADC applications. For sub-sampling TIADCs with the input at the first four Nyquist bands, the synthesized calibration system occupies 0.04\rm mm^2 of area and dissipates a total power of 33.2mW. For the baseband TIADC applications, it occupies 0.02\rm mm^2 and consumes 15.5mW. [ABSTRACT FROM AUTHOR]

A low-power continuous-time delta-sigma modulator (CTDSM) incorporating a multi-bit feedback-assisted quantizer (FBAQ) is presented in this paper. The proposed multi-bit quantizer is placed in a negative feedback loop to reduce the signal swing at its input. As a result, the number of comparator required for signal quantization is reduced. Furthermore, the modulator is optimized for low-voltage swing operation, in which the excess-loop-delay compensation is embedded without requiring additional hardware. With a 240-MHz sampling clock, this CTDSM achieves a peak SNDR of 68.3 dB and a dynamic range of 71 dB over a 5-MHz signal bandwidth. Fabricated in a 90-nm CMOS process, this chip consumes 4.6 mW from a 1-V supply, which corresponds to a figure of merit (FoM) of 216 fJ/conversion-step. [ABSTRACT FROM AUTHOR]

This paper presents a 14-bit 250 MS/s ADC fabricated in a 180 nm CMOS process, which aims at optimizing its linearity, operating speed, and power efficiency. The implemented ADC employs an improved SHA with parasitic optimized bootstrapped switches to achieve high sampling linearity over a wide input frequency range. It also explores a dedicated foreground calibration to correct the capacitor mismatches and the gain error of residue amplifier, where a novel configuration scheme with little cost for analog front-end is developed. Moreover, a partial non-overlapping clock scheme associated with a high-speed reference buffer and fast comparators is proposed to maximize the residue settling time. The implemented ADC is measured under different input frequencies with a sampling rate of 250 MS/s and it consumes 300 mW from a 1.8 V supply. For 30 MHz input, the measured SFDR and SNDR of the ADC is 94.7 dB and 68.5 dB, which can remain over 84.3 dB and 65.4 dB for up to 400 MHz. The measured DNL and INL after calibration are optimized to 0.15 LSB and 1.00 LSB, respectively, while the Walden FOM at Nyquist frequency is 0.57 pJ/step. [ABSTRACT FROM AUTHOR]

The increasing demand for integrating multiple wireless services in one multi-standard handset, exemplified by the software-defined radio (SDR) model, calls for digitizing wireless receivers in a quest for flexibility. Radio-frequency (RF) front-end and analog baseband filters need to be exchanged for digital processing at the expense of a highly challenging analog-to-digital converter (ADC) specifications. In this paper, the sensitivities of continuous-time (CT) delta-sigma (\Delta \Sigma) ADCs, which are candidate architectures for multi-standard receivers and SDRs, to out-of-band (OOB) blockers at the ADC input are investigated. This analysis addresses the problems and performance limitations that can result from large OOB blockers appearing at the input of CT \Delta \Sigma modulators in a digitized multi-standard receiver. Analysis and discussions given in different sections of the paper are verified by CT system-level simulations. [ABSTRACT FROM PUBLISHER]

In battery-powered medical instrumentation, the resolution and signal bandwidth of analog-to-digital converters (ADCs) have to be adapted to the needs of the application to avoid power wastage. This paper presents a reconfigurable successive approximation register (SAR) ADC implemented in 130 nm CMOS that resolves 5–14 bit with a maximum achievable effective number of bits (ENOB) of 13.5 using non-subtractive dither. In the proposed ADC design, the power consumption can be traded for accuracy to improve the energy efficiency and extend its application range, while reducing system integration complexity. A figure-of-merit (FoM) of 59 fJ/conversion is achieved at 1.2 V supply and the converter occupies an area of 0.42 mm^2. Measurement results of the ADC integrated in a multi-channel analog front-end (AFE) circuit show the suitability of the ADC for portable medical monitoring devices. [ABSTRACT FROM PUBLISHER]

This paper proposes a multi-bit incremental analog-to-digital converter (ADC) based on successive approximation (SA) for column-parallel readout circuits. The proposed ADC suppresses the random noise and enhances the resolution by embedding the conventional SA ADC with an integrator and decimation filter. In addition, the operating speed is increased through the two-step operations of coarse conversion with the proposed ADC and fine conversion with the embedded SA ADC. A residue fitting method is adopted to adjust the residue voltage to the fine conversion range after the coarse conversion. The proposed ADC with 12-bit resolution was fabricated using a 0.13 \mum CMOS image sensor process with a pixel array that has an image format of 648 \times 488 and a pixel size of 5.6\ \mum\times 5.6\ \mum. The measured results show a random noise of 108 \muV, a dynamic range of 60.9 dB, a differential nonlinearity of +1.02/-0.34 least significant bit (LSB), and an integral nonlinearity of +0.64/-0.54 LSB. [ABSTRACT FROM AUTHOR]

In this paper, a low-voltage fourth-order 2-2 cascade delta–sigma (\Delta\Sigma) modulator using the proposed double-sampling switched-operational-amplifier (SOP)-based integrator is presented. In the analog part of the \Delta\Sigma modulator, most of the power consumption comes from the SOP used in the integrator. Hence, the requirement of the SOP must effectively be relaxed to reduce the power consumption of the modulator. In each cascade stage, the second-order \Delta\Sigma modulator with a cascade-of-integrators input feedforward structure is used to reduce the output swing. The second integrator output of the first stage is directly connected to the second stage to simplify circuit design on the analog part. Furthermore, the double-sampling SOP-based integrator is also adopted to reduce the applied clock frequency by half. In this paper, systematic means of designing the presented modulator and searching the minimum current of the SOP in a specified supply voltage are also developed. The presented \Delta\Sigma modulator is fabricated in a 0.18-\mu\m 1P6M CMOS technology. The chip core area without PADs is 1.57 \mm^2. The modulator achieves an 84-dB peak signal-to-noise plus distortion ratio and an 88-dB dynamic range in 20-kHz signal bandwidth with a clock frequency of 2 MHz. The power consumption of the presented modulator core is 0.66 mW at a supply voltage of 1 V. The presented modulator can also be operated in a wide range of supply voltages from 1.8 V down to 0.9 V without seriously degrading the performance. [ABSTRACT FROM PUBLISHER]

This paper proposes using a 3-bit ADC to blindly sample the received data from a channel with 20 dB loss at Nyquist at 3x the baud rate. By moving from 2x to 3x sampling, we reduce the required ADC resolution from 5-bit to 3-bit, thereby reducing the overall power consumption by a factor of 2. Measurements from our test chip fabricated in Fujitsu's 65 nm CMOS show a high frequency jitter tolerance of 0.25 UIpp for a 5 Gb/s PRBS31 with a 60" FR4 channel. [ABSTRACT FROM AUTHOR]

This paper presents an analog-to-digital converter (ADC) dedicated to neural recording systems. By using two continuous-time incremental sigma-delta ADCs in a pipeline configuration, the proposed ADC can achieve high-resolution without sacrificing the conversion rate. This two-step architecture is also power-efficient, as the resolution requirement for the incremental sigma-delta ADC in each step is significantly relaxed. To further enhance the power efficiency, a class-AB output stage and a dynamic summing comparator are used to implement the sigma-delta modulators. A prototype chip, designed and fabricated in a standard 0.18 \mum CMOS process, validates the proposed ADC architecture. Measurement results show that the ADC achieves a peak signal-to-noise-plus-distortion ratio of 75.9 dB over a 4 kHz bandwidth; the power consumption is 34.8 \muW, which corresponds to a figure-of-merit of 0.85 pJ/conv. [ABSTRACT FROM AUTHOR]

Due to its high resolution, small silicon area, and reasonable conversion rate, extended counting analog to digital conversion (EC-ADC) has become a competitive candidate for application in the readout circuits of high accuracy sensors. In this paper, an EC-ADC for large scale sensor arrays is proposed. At the system level, a double-sampling configuration for incremental \Sigma\Delta modulators is proposed. By applying this configuration, the clock frequency of EC-ADC can be almost halved for the same conversion accuracy and rate. At the circuit level, the contribution of class-AB operational transconductance amplifier (OTA) structure to the low power design is analyzed and a class-AB OTA applicable for EC-ADC is developed. The proposed architecture has been implemented using a commercial 0.18 \mum CMOS technology. Measured results show that a power consumption of less than 77 \muW can be achieved at the conversion rate of 51.2 Ksamples/s and 12.2-bit accuracy respectively. The converter core occupies 0.044 mm^2. [ABSTRACT FROM AUTHOR]

This paper presents a new ADC architecture called partially active flash ADC. A 10 GS/s 6 b four-way time-interleaved ADC prototype in 65 nm CMOS demonstrated that this new ADC architecture offers better power efficiency than traditional ADC architectures in the \geq10 GS/s speed range. Various considerations towards high-speed ADC designs are discussed including a proposed source-follower based boot-strap track-and-hold circuit to reduce input kickback and improve the ADC bandwidth. Also discussed is the generation and skew calibration of the four-phase clocks for the interleaved channels to improve the ADC effective resolution at high input frequencies. By deriving the four-phase clocks from a Nyquist frequency input clock through pass gates, accurate timing skew calibration is achieved through a simple duty-cycle correction. Measured SNDR is 34.3 dB at low input frequencies and 32.0 dB at the Nyquist input frequency. The ADC including the input clock buffer consumes 83 mW with a FOM of 197 fJ/cs. [ABSTRACT FROM AUTHOR]

In this paper we present a fixed window level crossing sampling analog to digital convertor for bio-potential recording sensors. This is the first proposed and fully implemented fixed window level crossing ADC without local DACs and clocks. The circuit is designed to reduce data size, power, and silicon area in future wireless neurophysiological sensor systems. We built a testing system to measure bio-potential signals and used it to evaluate the performance of the circuit. The bio-potential amplifier offers a gain of 53 dB within a bandwidth of 200 Hz–20 kHz. The input-referred rms noise is 2.8 \muV. In the asynchronous level crossing ADC, the minimum delta resolution is 4 mV. The input signal frequency of the ADC is up to 5 kHz. The system was fabricated using the AMI 0.5 \mum CMOS process. The chip size is 1.5 mm by 1.5 mm. The power consumption of the 4-channel system from a 3.3 V supply is 118.8 \muW in the static state and 501.6 \muW with a 240 kS/s sampling rate. The conversion efficiency is 1.6 nJ/conversion. [ABSTRACT FROM PUBLISHER]

Accurate measurement of aperture jitter for high-speed data converters is a difficult problem, since aperture jitter should be precisely separated from other jitter components as well as additive noise. This problem results in low test accuracy and high-yield loss. This paper presents a novel methodology for accurately predicting aperture jitter using a cost-effective loopback methodology. By using an efficient spectral loopback scheme, aperture jitter is precisely separated from input jitter and clock jitter as well as additive noise present in the DUT. Hardware measurement results show that this approach can be effectively used to predict the aperture jitter of a DUT, with an 89% reduction in the prediction error compared with previous approaches. [ABSTRACT FROM PUBLISHER]

Digital current-mode control is a dual-loop control which potentially results in a better transient response and thus is more favorable than voltage-mode control. There are only a few publications on how to design and implement a fully integrated digital controller as the on-chip implementation is very challenging, especially for current-mode control. This paper addresses those design challenges and considerations. One of the main challenges is to efficiently sample and quantize both the output voltage and inductor current of the buck converter for control purposes. A time-multiplex scheme is used for the control-loop which enables the converter to work with a single ADC. A modified delay-lock-loop DPWM has been developed for minimizing the mismatch of the delay-cells. This enhances the accuracy at high frequency to prevent limit-cycle. A new algorithm has also been proposed for implementing look-up-table digital compensators with 20% less chip area. A converter with the fully integrated digitally controlled loop, including the single ADC, digital compensators and DPWM, has been fabricated in a CMOS 0.35 \mum process with a chip area of 1049 \mum \times\,1533 \mum. Measurement results show that the buck converter has a load transient response of 20 \mus, which is one of the fastest compared to other state-of-the-art digitally controlled buck converter. [ABSTRACT FROM PUBLISHER]

Digital receiver frontends have emerged as a possible solution for the next-generation serial I/O receiver design in advanced CMOS technologies. The challenge is to achieve low power dissipation so that the I/O links can be integrated in large ASICs. With a power budget of < 20~\mW/Gb/s, the feasibility of an ADC-based receiver is limited by the high-speed analog-to-digital converter (ADC) and complex digital processing in current fabrication technologies. In this paper, various designs and architectures for each component of an ADC-based receiver and their performance trade-offs are discussed. The design requirement of an ADC and digital processing can be relaxed with the aid of simple mixed-mode circuitry. More complex digital processing techniques are becoming feasible with the scaling of CMOS technology. However, the improvement from scaling is limited by the substantial leakage current, and the rate of improvement is slowing beyond 32 nm technology node. [ABSTRACT FROM PUBLISHER]

Using a tracking analog-to-digital converter as the quantizer of a sigma–delta modulator (SDM) has been shown to be an efficient method of reducing the number of comparators. In this paper, a new continuous-time (CT) SDM is proposed where a large reduction in the number of comparators is obtained by clocking the quantizer tracking loop at a high frequency rate. For a given example, the number of bits of the quantizer is shown to be reduced from five in the original multibit modulator to only one in a quantizer with tracking sampled at three times the original sampling frequency. In addition, the output of the tracking quantizer can be downsampled so that the modulator output has the same resolution and sampling rate as the original modulator. In this way, the design of the digital-to-analog converters in the feedback loop and the decimator filter at the modulator output are not penalized. Furthermore, the digital integrator of the tracking loop can be removed by taking profit of the last CT integrator in the forward path. Finally, the signal component in the forward path can be attenuated by adding a direct path from the modulator input to the last integrator input. As a result, the output swing of the integrators is reduced, improving the linearity of the whole modulator. The new modulators are analyzed and extensive theoretical and simulation results are provided. [ABSTRACT FROM PUBLISHER]

This paper describes a timing-skew calibration technique which equalizes the phase spacings among multiphase clocks. The scheme uses simple sample-and-hold circuits controlled by the multiphase clocks to sample a common reference input. Phase spacing is measured by counting the number of zero crossings between two adjacent sampling sequences. A zero-crossing detection scheme is proposed. It has better immunity against the offsets of the comparators used in the detector. A digital calibration processor is also proposed. It examines the outputs from the zero-crossing detectors, and then adjusts the delays of clock buffers in order to minimize timing skews. The proposed calibration scheme does not demand stringent requirement for the reference input. Its application to a eight-channel 6-b time-interleaved analog-to-digital converter is demonstrated. [ABSTRACT FROM AUTHOR]

This article presents an ultra-low power counter structure for a column-parallel single-slope analog-to-digital converter (SS-ADC) in CMOS image sensors. The proposed counter employs a two-step logical shift algorithm-based correlated double sampling (CDS) scheme. The logical shift algorithm can reduce parasitic capacitances, driving frequency, and inner toggling nodes by using the minimum number of transistors and a single-direction counter structure. Moreover, the two-step counting and double data rate scheme in the LSB counter can halve the operating clock frequency, resulting in further decreased power consumption. A prototype sensor was fabricated using a 110 nm CMOS image sensor process. The measurement results show that the proposed SS-ADC with a two-step counter consumes $2.4~\mu \text{W}$ power per column and shows a differential nonlinearity of +0.38/−0.25 LSB and an integral nonlinearity of +0.75/−0.5 LSB. The total power consumption is 2.25 mW for $640 \times 480$ effective image resolution at 60 frame rates with 3.3 V/1.5 V supply voltage. [ABSTRACT FROM AUTHOR]

An energy-efficient sampling architecture for time interleaved (TI) successive approximation register (SAR) analog-to-digital converters (ADCs) is proposed. The architecture avoids the use of sampling buffers in order to minimize the number of noise sources on the input signal path and to reduce the power consumption on the track-and-hold (T&H) circuit. In addition, the noise optimization enables a size shrinking on the SAR ADC and, consequently, an extra power saving on the TI-ADC. This last optimization becomes particularly interesting in new CMOS technology nodes with high metal–capacitor matching. The tradeoffs of the typical hierarchical TI-ADC architecture are formulated and analyzed in comparison with this proposal. As an implementation example, an 8-bit 3.2-GS/s TI-ADC SAR is designed and fabricated in a 0.13- $\mu \text{m}$ CMOS process. The implemented design uses four front sampling switches (phases), each one followed by eight asynchronous SAR ADCs. The design avoids all static current consumption across full input signal path up to digital output, pushing full TI-ADC efficiency to values similar to those achieved by the single SAR ADC unit. Measurements of the fabricated TI-ADC show 44.6-dB peak signal-to-noise-and-distortion ratio (7.12 effective number of bits) and 105-mW power consumption at 1.2 V. [ABSTRACT FROM AUTHOR]

A high-speed dynamic biasing technique is presented for reducing op amp power in discrete-time, multistage, analog circuits employing op amp sharing. To exploit typical power scaling in such circuits, a charge pump, of which the on-times of up and down currents are controlled by two comparators, performs rapid change of the op amp bias condition between a low-current mode and a high-current mode during nonoverlapping clock periods of the two phase clocks. The errors caused by finite comparator delay are compensated for by embedding intentional offset voltages in the comparators, which are implemented by using asymmetric differential input pairs in the comparators. To verify the efficacy of the proposed biasing technique, an 11-b pipelined analog-to-digital converter (ADC) has been implemented using 0.15- \mu \textm devices in a 28-nm CMOS technology. With a 20-MHz sampling clock, the ADC achieves a 61.8-dB SNDR while consuming a 2.24-mW power from a 1.8-V supply. The MDAC and ADC power are reduced by about 45% and 30%, respectively, compared with a conventional pipelined ADC employing an op amp in each MDAC. Owing to the simple structure of the proposed dynamic biasing, the prototype ADC occupies only 0.052 mm2. [ABSTRACT FROM AUTHOR]

We propose an analog-to-digital converter (ADC) architecture, implemented in an FPGA, that is fully reconfigurable and easy to calibrate. This approach allows to alter the design, according to the system requirements, with simple modifications in the firmware. Therefore it can be used in a wide range of operating conditions, including a harsh cryogenic environment. The proposed architecture employs time-to-digital converters (TDCs) and phase interpolation techniques to reach a sampling rate, higher than the clock frequency (maximum 400 MHz), up to 1.2 GSa/s. The resulting FPGA ADC can achieve a 6 bit resolution (ENOB) over a 0.9 to 1.6 V input range and an effective resolution bandwidth (ERBW) of 15 MHz. This implies that the ADC has an effective Nyquist rate of 30 MHz, with an oversampling ratio of $40\times $ . The system non-linearities are less than 1 LSB. The main advantages of this architecture are its scalability and reconfigurability, enabling applications with changing demands on one single platform. [ABSTRACT FROM PUBLISHER]

A reconfigurable 65-nm continuous-time low-pass delta-sigma modulator operates with a sampling frequency from 491 MHz to 1536 MHz, a signal bandwidth from 10 MHz to 100 MHz, and a dynamic range of 75.4 dB to 62.8 dB, respectively. Flash ADC calibration and reference shuffling with zipper rotation are used to improve the linearity of the flash, while also increasing the highest sampling rate and bandwidth of the modulator. Dynamic element matching using a randomized incremented pointer improves the linearity of the DAC. [ABSTRACT FROM AUTHOR]

Bench characterization of wide band oversampled converters is a challenge due to the high data rate at the output of the modulator. We propose the use of a duobinary test interface to extend the frequency range over which reliable laboratory measurements become possible. We show that using such an interface effectively randomizes the modulator output data and reduces high frequency content, thereby reducing the bandwidth demands made on the test equipment. It also reduces degradation of the modulator performance caused by package feedthrough effects. Experimental results from a test chip in 90 nm CMOS show that the proposed interface extends the upper sampling frequency limit of an existing single-bit CTDSM from 3.6 GHz to 4.4 GHz. [ABSTRACT FROM AUTHOR]

A novel time-domain bulk-tuned offset cancellation technique is applied to a low-power high-precision dynamic comparator to reduce its input-referred offset with minimal additional power consumption and delay. The design has been fabricated in a commercially available 0.5-\mum process. Measurement results of 10 circuits show a reduction of offset standard deviation from 5.415 mV to 50.57 \muV, improved by a factor of 107.1. The offset cancellation scheme does not introduce observable offset or noise, and can achieve fast and robust convergence with a wide range of common mode input. Operating at a supply of 5 V and clock frequency of 200 kHz, the comparator together with the OC circuitry consumes 4.65 \muW of power, or 23 pJ of energy per comparison. [ABSTRACT FROM PUBLISHER]

Online adaptive equalization is proposed to calibrate channel mismatch errors in time-interleaved (TI) analog-to-digital converter (ADC) arrays with a linear reference path. Code-domain filters are shown to be effective in removing interchannel as well as intrachannel nonlinearity and mismatch errors, including offset, gain, and differential nonlinearity (DNL) and integral nonlinearity (INL) mismatches. An 8-bit, 600-MS/s, 0.13- μm CMOS prototype measured a signal-to-noise plus distortion ratio (SNDR) of 31.0/47.4 dB, a spurious-free dynamic range (SFDR) of 32.8/63.6 dB, a DNL of 1.30/0.30 LSBs, and an INL of 1.70/0.23 LSBs in lab testing without/with equalization, respectively. [ABSTRACT FROM PUBLISHER]

A novel technique for the digital background calibration of time-interleaved analog-to-digital converters is proposed. The technique corrects at the same time for both errors due to gain, offset and timing mismatches among the time-interleaved channels and errors due to nonlinearities in the channels, for instance due to capacitor mismatches in switched capacitor implementations. This feature, together with the use of the recursive least mean squares algorithm, makes the technique particularly fast (12 bits of accuracy can be achieved after about 4000 samples for a two-channel converter). The proposed calibration technique employs wideband differentiators, thus enabling digital background calibration of timing skews even with wideband input signals. Besides, undersampled differentiator filters are proposed, and it is shown that the technique is capable of calibrating undersampling converters by estimating the derivative of wideband input signals even outside the first Nyquist band. [ABSTRACT FROM PUBLISHER]

In a nonideal PLL circuit, leakage of the reference signal into the control line produces spurious tones. When the distorted PLL signal is used as a sampling clock to an analog-to-digital converter (ADC), it creates spurious sidebands in the sampled data as well. In spectrum sensing applications, the presence of spurious sidebands can lead to false detection of signals in otherwise empty channels. To remove the spurious sidebands, we first estimate the distortions to the sampled data and then compensate the data in the digital domain. To reduce hardware complexity and computation cost, we propose an algorithm that uses a Fourier Transform block (a typical component in spectrum sensing architectures) to estimate the sampling errors from the spurious sidebands. We also analyze the effects of the spurious sidebands on spectrum sensing. Computer simulations are included to show that the proposed solution can remove the spurious sidebands and improve the detection performance. [ABSTRACT FROM PUBLISHER]

High-resolution, moderate-speed, calibration-free analog-to-digital converters (ADCs) are becoming increasingly difficult to design in low-voltage nanometer-scale CMOS processes. We propose an ADC architecture based on a resetting \Sigma \Delta modulator that achieves high resolution, despite poor component matching and poor analog transistor performance. A prototype design pipelines a second-order resetting \Sigma \Delta modulator and a 10 b cyclic ADC. The device achieves 14 b resolution and samples as a Nyquist converter at 23 MS/s. This calibration-free ADC achieves no missing codes, 87 dB SFDR and 11.7 b ENOB. The ADC is fabricated in 0.18 \mum CMOS and occupies a core area of 0.5 mm^2. It consumes 48 mW from a 2 V supply. [ABSTRACT FROM PUBLISHER]