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This paper defines a new type of a low-power broadside test, called a reverse low-power broadside test, whose application requires design-for-testability logic. The unique feature of a reverse low-power broadside test is that it duplicates the switching activity during the second functional capture cycle of a given low-power broadside test, except that signal-transitions are reversed. Thus, the switching activity of a reverse low-power broadside test duplicates that of a low-power broadside test in every subcircuit and on every line individually. In addition, the reversed test detects different faults, and can thus increase the fault coverage of a low-power broadside test set. This paper studies the ability of reverse low-power broadside tests to increase the transition fault coverage in benchmark circuits considering functional broadside tests as well as low-power broadside tests that are not functional. [ABSTRACT FROM AUTHOR]

Securing the intellectual property (IP) from counterfeiting is an important goal toward trustworthy computing. Camouflaging of logic gates is a well-known technique to prevent an adversary from de-layering the chip and stealing IP. In this paper, we propose threshold voltage modulation to realize 2-input static camouflaged logic that can hide six functionalities. We extend the concept of threshold-voltage defined logic to propose multi-input camouflaged gates capable of hiding six 3-input Boolean functions (NAND, NOR, AOI, OAI, XOR, and XNOR). We also propose interconnect camouflaging technique which hides the original connectivity of nets using a novel threshold-voltage defined pass transistor mux. Since threshold voltages are asserted during fabrication and are difficult to identify during optical reverse engineering (RE)-based techniques, the adversary will be forced to launch a brute-force search. We present a thorough analysis of RE effort and overheads associated with the proposed camouflaging techniques. The proposed methodology is demonstrated using fabricated test-chip in 65 nm technology. [ABSTRACT FROM AUTHOR]

Test vector omission allows the length of a functional test sequence to be reduced without reducing its fault coverage. When a circuit is embedded in a design, the omission of test vectors from a functional test sequence for the circuit may result in a sequence that does not satisfy the functional constraints imposed by the design. This paper addresses this issue by developing a procedure that restores omitted test vectors in order to satisfy functional constraints. For the discussion in this paper, functional constraints are captured by the switching activity of the sequence before any test vectors are omitted from it. This is referred to as its functional switching activity profile. Experimental results demonstrate that the length of a sequence can be reduced even after restoration of omitted test vectors based on its functional switching activity profile. [ABSTRACT FROM AUTHOR]

Modern system-on-chip designs implement sophisticated power management features to achieve better energy efficiency. This includes power-down modes for analog circuit blocks. Typically, they are implemented by additional power-down circuitry which shuts down all bias currents. During the design of power-down circuitry, it must be ensured that the circuit still meets all specifications in normal operation. Furthermore, floating nodes and asymmetric stress need to be avoided in order to reduce device degradation over time. Therefore, the manual design of power-down circuitry can become a challenging and time consuming task requiring alternating implementation and verification phases. In this paper, a power-down synthesis methodology is presented which constructs fault-free power-down circuitry by systematically applying typical shutoff patterns. Furthermore, the synthesized power-down circuitry is visualized in the circuit schematic to support the designer in capturing the structure of the inserted power-down circuitry. Finally, the sizing of power-down transistors is determined automatically. Experimental results for three amplifier circuits, a voltage controlled ring oscillator and a low voltage differential signaling driver demonstrate the efficiency and efficacy of the presented methods. [ABSTRACT FROM PUBLISHER]

This paper introduces reconditioning: a novel systematic technique for reducing unnecessary power consumption of asynchronous gate-level netlists, which involves the optimal reordering of conditional communication and logic primitives. Our technique is applicable to asynchronous circuits with handshaking protocols that encode data and control together, in particular, quasi delay insensitive and 1-of- N handshaking circuits. Both an optimal integer linear program (ILP) and a fast heuristic algorithm are presented. We show that our ILP is feasible for moderate size circuits and our heuristic algorithm scales to much larger circuits, completing in seconds on circuits with tens of thousands of gates. Our experimental results show power improvement highly depends on the structure of the circuit but can often be above 26% with typically less than 5% area overhead. [ABSTRACT FROM AUTHOR]

Since the problem of power integrity has become a critical issue that limits design performance, obtaining the supply current waveforms at early design stages is essential to achieve efficient reduction of supply noise. Therefore, a high-level current macro model is proposed by Bodapati and Najm for logic blocks to provide fast current waveform estimation at register-transfer level (RTL). However, due to the different arrival time of internal signals, modeling the supply current of the entire logic block accurately as specific fixed templates is difficult. This paper thus proposes a levelized high-level current model for logic blocks. By merging gates with similar arrival time as a super-gate and recording its current waveforms separately, obtaining more accurate supply current waveforms is possible by using a unified model, even for multipeak cases. This paper also proposes a frequency-domain waveform transformation method to consider the effects of nonideal supply resistance on the supply current waveform. As shown in the experimental results, the peak error and waveform correlation of the proposed current model are significantly improved compared to the results of the single-stage current model. Using accurate supply current waveforms can also help obtain precise IR-drop estimation in RTL simulations for early system evaluation. [ABSTRACT FROM PUBLISHER]

Nowadays, power is a primary concern in digital circuits and clock distribution networks are particularly a significant power consumer. Therefore, clock gating is an effective technique in saving dynamic power by reducing the switching activities. In this paper, we propose a centralized and fine-grained microarchitecture-level clock gating for low power hardware accelerators which are automatically designed by high-level synthesis (HLS) tool. The basic principium of our idea is not to use any extra computation for generating clock enabled signals and exploit exiting signals of finite state machine for controlling the datapath clock network. After determining the current state in finite state machine, clock sub-tree of current state is enabled and the other sub-trees are disabled with a slight increase in circuit area. Our approach is implemented within an HLS design flow for automatic low power hardware accelerator generation in application specific integrated circuit design. Experimental results are obtained on a set of representative benchmark programs. Depending on the circuit size and number of registers, it is shown that 47%–86% reduction in power dissipation is observed. [ABSTRACT FROM PUBLISHER]

This paper introduces a novel test data compression scheme, which is primarily devised for low-power test applications. It is based on a fundamental observation that in addition to low test cube fill rates, a very few specified bits, necessary to detect a fault, are actually irreplaceable, whereas the remaining ones can be placed in alternative locations (scan cells). The former assignments are used to create residual test cubes and, subsequently, test templates. They control a power-aware decompressor and guide automatic test pattern generation to produce highly compressible test patterns through finding alternative assignments. The proposed approach reduces, in a user-controlled manner, scan shift-in switching rates with minimal hardware modifications. It also elevates compression ratios to values typically unachievable through conventional low-power reseeding-based solutions. Experimental results obtained for large industrial designs illustrate feasibility of the proposed test scheme and are reported herein. [ABSTRACT FROM AUTHOR]

Fan proposed a set of hyperuniversal switch blocks (HUSBs), called Fan’s (4, w )-HUSBs in this paper. He also proved that his design with w less than 6 was optimum. That is, they used the least switches to achieve hyperuniversal routability. However, we find a counter example to show that there is an unnecessary switch in Fan’s (4, 4)-HUSB. Namely, we propose a new (4, 4)-HUSB, water-molecule-shaped switch block (WMSB), proving (4, 4)-WMSB with 24 switches is optimal. Furthermore, we also propose optimal (4, 7)-WMSB, which is a (4, 7)-HUSB with 42 switches. [ABSTRACT FROM PUBLISHER]

As advances in manufacture technology, leakage current increases dramatically in modern ICs. By turning off supply voltage in a low-power domain with power switches, power gating becomes a useful technique in resolving this problem. Since number and locations of power switches have great impact on chip area and IR-drop, an efficient and effective approach to insert power switches is required for the power gating designs. Unlike previous works using the greedy algorithm to handle this problem, this paper uses a simplified model to approximate required equivalent resistance of power switches in a low-power domain, and then determines number and types of power switches based on the value. In order to reduce impact on preplaced standard cells, we also propose a mathematical approach to find locations with less placement density to place power switches. The proposed methodology was integrated into a real-design flow. Experimental results demonstrate that our approach can insert less number of power switches and still satisfy the IR-drop constraint than other approaches. [ABSTRACT FROM PUBLISHER]

Programmable reversible logic is emerging as a prospective logic design style for implementation in low power, low frequency applications where minimal impact on circuit heat generation is desirable, such as mitigation of differential power analysis attacks. Adiabatic logic is an implementation of reversible logic in CMOS where the current flow through the circuit is controlled such that the energy dissipation due to switching and capacitor dissipation is minimized. Recent advances in dual-rail adiabatic logic show reduction in average and differential power, making this design methodology advantageous in applications where security is the primary design metric and operating frequency is slower, such as Smart Cards. In this paper, we present an algorithm for synthesis of adiabatic circuits in CMOS. Then, using the ESPRESSO heuristic for minimization of Boolean functions method on each output node, we reduce the size of the synthesized circuit. Our approach correlates the horizontal offsets in the permutation matrix with the necessary switches required for synthesis instead of using a library of equivalent functions. The synthesis results show that, on average, the proposed algorithm represents an improvement of 36% over the best known reversible designs with the optimized dual-rail cell libraries. Then, we present an adiabatic S-box which significantly reduces energy imbalance compared to previous benchmarks. The design is capable of forward encryption and reverse decryption with minimal overhead, allowing for efficient hardware reuse. [ABSTRACT FROM PUBLISHER]

Guarded evaluation is a power reduction technique that involves identifying subcircuits (within a larger circuit) whose inputs can be held constant (guarded) at specific times during circuit operation, thereby reducing switching activity and lowering dynamic power. The concept is rooted in the property that under certain conditions, some signals within digital designs are not “observable” at design outputs, making the circuitry that generates such signals a candidate for guarding. Guarded evaluation has been demonstrated successfully for application-specific integrated circuits (ASICs); in this paper, we apply the technique to field-programmable gate arrays (FPGAs). In ASICs, guarded evaluation entails adding additional hardware to the design, increasing silicon area and cost. Here, we apply the technique in a way that imposes minimal area overhead by leveraging existing unused circuitry within the FPGA. The primary challenge in guarded evaluation is in determining the specific conditions under which a subcircuit's inputs can be held constant without impacting the larger circuit's functional correctness. We propose a simple solution to this problem based on discovering gating inputs using “noninverting” and “partial noninverting” paths in a circuit's AND-inverter graph representation. Experimental results show that guarded evaluation can reduce switching activity on average by as much as 32% and 25% for 6-input look-up table (6-LUT) and 4-LUT architectures, respectively. Dynamic power consumption in the FPGA interconnect is reduced on average by as much as 24% and 22% for 6-LUT and 4-LUT architectures, respectively. The impact to critical path delay ranges from 1% to 43%, depending on the guarding scenario and the desired power/delay tradeoff. [ABSTRACT FROM AUTHOR]

With lower supply voltages, increased integration densities and higher operating frequencies, power grid verification has become a crucial step in the very large-scale integration design cycle. The accurate estimation of maximum instantaneous power dissipation aims at finding the worst-case scenario where excessive simultaneous switching could impose extreme current demands on the power grid. This problem is highly input-pattern dependent and is proven to be NP-hard. In this paper, we capitalize on the compelling advancements in satisfiability (SAT) solvers to propose a pseudo-Boolean SAT-based framework that reports the input patterns maximizing circuit activity, and consequently peak dynamic power, in combinational and sequential circuits. The proposed framework is enhanced to handle unit gate delays and output glitches. In order to disallow unrealistic input transitions, we show how to integrate input constraints in the formulation. Finally, a number of optimization techniques, such as the use of gate switching equivalence classes, are described to improve the scalability of the proposed method. An extensive suite of experiments on ISCAS85 and ISCAS89 circuits confirms the robustness of the approach compared to simulation-based techniques and encourages further research for low-power solutions using Boolean SAT. [ABSTRACT FROM AUTHOR]