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A multisine excitation signal enables fast and statistically robust measurement of the nonlinear behavior of analog devices under test. This paper describes the design considerations and constraints of a multisine excitation signal when it is applied to analog-to-digital converter testing. A novel phase-plane uniformity objective function followed by an optimization procedure is proposed to optimize the multisine excitation signal. Performance comparison between the proposed multisine design and other alternative multisine design is carried out. It is demonstrated that the proposed phase-space uniform multisine enables better representation of the conversion error distribution compared with existing multisine designs. This results in a more accurate assessment of the analog-to-digital converter performance. [ABSTRACT FROM PUBLISHER]

An automated frequency selection algorithm for dual-tone analog-to-digital converter sine-wave test that guarantees optimal test coverage in the phase-plane is presented. The proposed method relaxes some constraints of the existing phase-space design methodology. This enables wider application of the phase-space method in test frequency selection. The proposed algorithm also extends the previous works by generating a good frequency pair while taking into account various hardware constraints in the production environment. Quality measures for phase-plane coverage is proposed and evaluated, followed by the theoretical analysis and description of the phase-plane uniformity. Extensive computer simulation is carried out to validate the proposed technique. [ABSTRACT FROM AUTHOR]